Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정해준 | - |
dc.date.accessioned | 2022-10-07T01:30:59Z | - |
dc.date.available | 2022-10-07T01:30:59Z | - |
dc.date.issued | 2020-07 | - |
dc.identifier.citation | PHYSICAL REVIEW APPLIED, v. 14, no. 1, article no. 014007 | en_US |
dc.identifier.issn | 2331-7019 | en_US |
dc.identifier.uri | https://journals.aps.org/prapplied/abstract/10.1103/PhysRevApplied.14.014007 | en_US |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/175106 | - |
dc.description.abstract | We derive upper bounds to free-space concentration of electromagnetic waves, mapping out the limits to the maximal intensity for any spot size and optical-beam-shaping device. For sub-diffraction-limitedoptical beams, our bounds suggest the possibility for orders-of-magnitude intensity enhancements compared with existing demonstrations, and we use inverse design to discover metasurfaces operating near these new limits. We also demonstrate that our bounds may surprisingly describe maximal concentration defined by a wide variety of metrics. Our bounds require no assumptions about symmetry, scalar waves, or weak scattering, instead relying primarily on the transformation of a quadratic program via orthogonal-projection methods. The bounds and inverse-designed structures presented here can be useful for applications from imaging to three-dimensional printing. | en_US |
dc.description.sponsorship | We thank Michael Fiddy and Lawrence Domash for helpful conversations. H.S., H.C., and O.D.M. were partially supported by the U.S. Defense Advanced Research Projects Agency and Triton Systems under Grant No. 140D6318C0011 and were partially supported by the U.S. Air Force Office of Scientific Research under Grant No. FA9550-17-1-0093. | en_US |
dc.language.iso | en | en_US |
dc.publisher | AMER PHYSICAL SOC | en_US |
dc.title | Maximal free-space concentration of electromagnetic waves | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1103/PhysRevApplied.14.014007 | en_US |
dc.relation.journal | PHYSICAL REVIEW APPLIED | - |
dc.contributor.googleauthor | Shim, Hyungki | - |
dc.contributor.googleauthor | Chung, Haejun | - |
dc.contributor.googleauthor | Miller, Owen D. | - |
dc.relation.code | 2020048843 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | SCHOOL OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | haejun | - |
dc.identifier.orcid | https://orcid.org/0000-0001-8959-237X | - |
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