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DC FieldValueLanguage
dc.contributor.author김근배-
dc.date.accessioned2022-09-19T06:25:01Z-
dc.date.available2022-09-19T06:25:01Z-
dc.date.issued2020-12-
dc.identifier.citationIEEE ACCESS, v. 8, page. 217282-217289en_US
dc.identifier.issn2169-3536-
dc.identifier.urihttps://ieeexplore.ieee.org/document/9274324-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/172994-
dc.description.abstractA method for blind estimation of interleaver parameter was recently reported which made additional data from a limited amount of received data. However, the process of making additional data creates undesirable linearity which degrades estimation performance. Promise for improved estimation therefore lies in enhancing blind estimation of interleaver parameter without making additional data. In this paper, we propose an improved method to blindly estimate interleaver parameter under the condition of scant data. We first generate a matrix by using the received data. From this matrix we then make square submatrices and obtain their rank deficiency distribution. Finally, we estimate the interleaver parameter by comparing the rank deficiency distribution of the square submatrices and that of random binary matrices. Through computer simulations, we validate the proposed method in terms of detection probability and the number of false alarms. Simulation results show that the proposed method works better than the conventional method given scarce received data.en_US
dc.description.sponsorshipThis work was supported by the Research Fund of the Signal Intelligence Research Center supervised by the Defense Acquisition Program Administration and Agency for Defense Development of Korea.en_US
dc.language.isoenen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectBlind detectionen_US
dc.subjectnon-cooperative contexten_US
dc.subjectremote sensingen_US
dc.subjectspectrum surveillanceen_US
dc.titleBlind Interleaver Parameter Estimation From Scant Dataen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ACCESS.2020.3041795-
dc.relation.journalIEEE ACCESS-
dc.contributor.googleauthorJang, Mingyu-
dc.contributor.googleauthorKim, Geunbae-
dc.contributor.googleauthorKim, Dongyeong-
dc.contributor.googleauthorYoon, Dongweon-
dc.relation.code2020045465-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentSCHOOL OF ELECTRONIC ENGINEERING-
dc.identifier.pidgbkim-
dc.identifier.researcherIDF-1205-2018-
dc.identifier.orcidhttps://orcid.org/0000-0003-3262-091X-


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