청소년의 PTSD 증상 경험에 있어 외상 수, 외상 강도, 행동활성화체계(BAS), 행동억제체계(BIS)의 영향

Abstract

The purpose of this study is to find out about the number, the intensity, and the severity of adolescents’ lifetime experience of traumatic events and explore these factors’ relationship with their behavioral activation system (BAS) and behavioral inhibition system(BIS). Furthermore, this study investigated if these behavioral traits play a role in developing PTSD symptoms from the main stressor, which is the trauma itself. For this purpose, participants aging from 12 to 24, all from non-clinical settings, such as middle school and youth shelters in Seoul, answered questionnaires. Only the data of those that reported experiencing at least one traumatic event, which is 104 adolescents (male: 57, female: 47) have been analyzed in this study. The Korean Behavioral Activation and Behavioral Inhibition scale for adolescents, the Stressful Life Events Screening Questionnaire, and the Korean Impact of Events Scale Revised were used to measure the factors involved. IBM SPSS 22.0 was used for correlation analysis and to perform regression analysis. As the result of the correlation analysis, the number, intensity, and severity of the trauma all had significant positive correlation with both BAS and BIS. PTSD and BIS had significant positive correlation, but PTSD did not show correlation with BAS. In the regression analysis of the number and the intensity of the trauma affecting PTSD symptoms, BAS and BIS together added determination value to this relationship, especially BIS being significant. The purpose of this study was to reconsider the impact of trauma by investigating the number, intensity, severity of adolescents’ experiences in traumatic events and the relationship they have with BAS and BIS. Also, by finding out these behavioral activation and inhibition systems can have determinant value in PTSD symptoms, this study had contributed in understanding PTSD etiology. The meaning and the limitations of this study has been discussed in this context.