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dc.contributor.author백상현-
dc.date.accessioned2022-02-03T02:10:58Z-
dc.date.available2022-02-03T02:10:58Z-
dc.date.issued2008-12-
dc.identifier.citation한국테스트협회논문집en_US
dc.identifier.urihttp://www.koreatest.or.kr/sub02/2008data/report/08-022.pdf-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/167209-
dc.description.abstractDefective capacitors in AC-coupled interconnections can significantly reduce the performance of interconnection channels. Step pulse response is often used to see ISI of a channel. In this paper, the response of a step pulse is proposed to be measured for the purpose of testing AC-coupling capacitors. Hysteresis buffer is used to measure ISI at regular intervals, which is not necessarily same as bit interval. The hysteresis range is iteratively programmed to measure the ISI signals. The result of proposed method showed great capabilities of detecting defective AC-coupling capacitors.-
dc.language.isoko_KRen_US
dc.publisher한국테스트협회en_US
dc.titleHysteresis 버퍼를 이용한 AC 커플링 커패시터 테스트en_US
dc.title.alternativeAC Coupling Capacitor Test using Hysteresis Bufferen_US
dc.typeArticleen_US
dc.relation.journal한국테스트협회논문집-
dc.contributor.googleauthor오정균-
dc.contributor.googleauthor김민석-
dc.contributor.googleauthor백상현-
dc.relation.code2012210449-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidbau-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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