Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 백상현 | - |
dc.date.accessioned | 2022-02-03T02:10:58Z | - |
dc.date.available | 2022-02-03T02:10:58Z | - |
dc.date.issued | 2008-12 | - |
dc.identifier.citation | 한국테스트협회논문집 | en_US |
dc.identifier.uri | http://www.koreatest.or.kr/sub02/2008data/report/08-022.pdf | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/167209 | - |
dc.description.abstract | Defective capacitors in AC-coupled interconnections can significantly reduce the performance of interconnection channels. Step pulse response is often used to see ISI of a channel. In this paper, the response of a step pulse is proposed to be measured for the purpose of testing AC-coupling capacitors. Hysteresis buffer is used to measure ISI at regular intervals, which is not necessarily same as bit interval. The hysteresis range is iteratively programmed to measure the ISI signals. The result of proposed method showed great capabilities of detecting defective AC-coupling capacitors. | - |
dc.language.iso | ko_KR | en_US |
dc.publisher | 한국테스트협회 | en_US |
dc.title | Hysteresis 버퍼를 이용한 AC 커플링 커패시터 테스트 | en_US |
dc.title.alternative | AC Coupling Capacitor Test using Hysteresis Buffer | en_US |
dc.type | Article | en_US |
dc.relation.journal | 한국테스트협회논문집 | - |
dc.contributor.googleauthor | 오정균 | - |
dc.contributor.googleauthor | 김민석 | - |
dc.contributor.googleauthor | 백상현 | - |
dc.relation.code | 2012210449 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DIVISION OF ELECTRICAL ENGINEERING | - |
dc.identifier.pid | bau | - |
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