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dc.contributor.author송익현-
dc.date.accessioned2021-10-20T01:47:37Z-
dc.date.available2021-10-20T01:47:37Z-
dc.date.issued2019-01-
dc.identifier.citationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 66, no. 1, page. 240-247en_US
dc.identifier.issn0018-9499-
dc.identifier.issn1558-1578-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8552448-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/165620-
dc.description.abstractWe provide "best practices" for single-event transient (SET) mitigation using electrostatic discharge (ESD) protection techniques. We investigate the correlation between SET suppression and RF performance when ESD protection circuits for SET mitigation are combined with various RF switches. The three different single-pole single-throw (SPST) switch configurations (conventional design, floating body, and floating body/n-well) were implemented to provide insight on how to best apply dc ESD protection techniques for also achieving robust SET mitigation. Based on two-photon absorption laser experiments and RF measurements, a conventional SPST switch configuration shows relatively poor RF performance but is effective for SET mitigation due to the SET discharge current path provided by ESD protection circuit. On the other hand, the combination of the SPST switch and the ESD circuit, which exhibits the best RF performance among the three configurations, is relatively vulnerable to SETs. Based on these results, strategies and methodologies for ESD protection techniques to effectively mitigate SET are proposed.en_US
dc.description.sponsorshipThis work was supported in part by the Defense Threat Reduction Agency (DTRA) under contract HDTRA1-16-1-0018, the Georgia Electronic Design Center (GEDC) and GlobalFoundries.en_US
dc.language.isoenen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectElectrostatic discharge (ESD)en_US
dc.subjectFET-based switchen_US
dc.subjectpulsed laseren_US
dc.subjectRF switchen_US
dc.subjectsingle-event transient (SET)en_US
dc.subjecttwo-photon absorption (TPA)en_US
dc.titleBest Practices for Using Electrostatic Discharge Protection Techniques for Single-Event Transient Mitigationen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume66-
dc.identifier.doi10.1109/TNS.2018.2884127-
dc.relation.page240-247-
dc.relation.journalIEEE TRANSACTIONS ON NUCLEAR SCIENCE-
dc.contributor.googleauthorCho, Moon-Kyu-
dc.contributor.googleauthorSong, Ickhyun-
dc.contributor.googleauthorFleetwood, Zachary E.-
dc.contributor.googleauthorKhachatrian, Ani-
dc.contributor.googleauthorWarner, Jeffrey H.-
dc.contributor.googleauthorBuchner, Stephen P.-
dc.contributor.googleauthorMcMorrow, Dale-
dc.contributor.googleauthorPaki, Pauline-
dc.contributor.googleauthorCressler, John D.-
dc.relation.code2019000143-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentSCHOOL OF ELECTRONIC ENGINEERING-
dc.identifier.pidisong-
dc.identifier.researcherIDT-8378-2019-
dc.identifier.orcidhttps://orcid.org/0000-0002-7669-9853-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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