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dc.contributor.author김병호-
dc.date.accessioned2021-09-09T05:25:11Z-
dc.date.available2021-09-09T05:25:11Z-
dc.date.issued2020-11-
dc.identifier.citation2020년도 대한전자공학회 추계학술대회 논문집, Page. 45-48en_US
dc.identifier.urihttps://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE10521687-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/165093-
dc.description.abstractCapacitor mismatches in a capacitive digital-to-analog converter (CDAC) degrade the linearity of a successive-approximation-register (SAR) analog-to-digital converter (ADC) in manufacturing process. This paper proposes a foreground calibration technique to efficiently calibrate the capacitor mismatches of CDAC using an additional variable capacitor based on the correlation analytically derived between capacitances of CDAC and the histogram results from the final ADC outputs. The simulation results verified the linearity enhancement, i.e., 0.75LSB of the differential non-linearity for SAR ADC using the proposed calibration technique.en_US
dc.language.isoko_KRen_US
dc.publisher대한전자공학회en_US
dc.titleHistogram기반 자가보정 SAR 아날로그-디지털 컨버터en_US
dc.title.alternativeSAR ADC with Histogram-based Foreground Self-Calibrationen_US
dc.typeArticleen_US
dc.relation.page45-48-
dc.contributor.googleauthor이강희-
dc.contributor.googleauthor김병호-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidbrandonkim-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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