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dc.contributor.author이정호-
dc.date.accessioned2021-08-27T06:30:39Z-
dc.date.available2021-08-27T06:30:39Z-
dc.date.issued2020-09-
dc.identifier.citationTHIN SOLID FILMS, v. 709, Article no. 138139, 8ppen_US
dc.identifier.issn0040-6090-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0040609020303497-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/164653-
dc.description.abstractThe poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS) and inverted pyramid n-silicon heterojunction solar cells have been extensively investigated based on their light trapping behaviour, rationally high efficiency and cost effectiveness. However, inferior junction conformity still remains a great challenge. In this work, we present the effect of passivation using aluminium oxide (Al2O3) on the front surface and titanium oxide (TiO2) on rear interface in the inverted pyramid -Si/PEDOT: PSS heterojunction solar cells using the atomic layer deposition technique. The front surface Al2O3 layer can enhance the surface energy, which generates the uniform coating of PEDOT:PSS, acting as an electron blocking layer. Furthermore, TiO2 thin layer deposited on rear interface works as a hole blocking layer, which can suppress the electrical losses and the charge recombination. The best cell demonstrated a conversion efficiency of 16.04% with an open-circuit voltage of 0.63 V, fill factor of 71.5% and a high current density of 35.45 mA/cm(2). These findings suggest a promising approach to attainment of next-generation hybrid solar cells.en_US
dc.language.isoen_USen_US
dc.publisherELSEVIER SCIENCE SAen_US
dc.subjectSi/PEDOTen_US
dc.subjectPSSen_US
dc.subjectHybrid solar cellsen_US
dc.subjectInverted pyramidsen_US
dc.subjectInterfacial passivationen_US
dc.subjectAtomic layer depositionen_US
dc.titleEffect of interfacial passivation on inverted pyramid silicon/poly(3,4-ethylenedioxythiophene):Poly(styrenesulfonate) heterojunction solar cellsen_US
dc.typeArticleen_US
dc.relation.volume709-
dc.identifier.doi10.1016/j.tsf.2020.138139-
dc.relation.page1-8-
dc.relation.journalTHIN SOLID FILMS-
dc.contributor.googleauthorAli, Gohar-
dc.contributor.googleauthorShinde, Sambhaji S.-
dc.contributor.googleauthorSami, Abdul-
dc.contributor.googleauthorKim, Sung–Hae-
dc.contributor.googleauthorWagh, Nayantara K.-
dc.contributor.googleauthorLee, Jung-Ho-
dc.relation.code2020048030-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING-
dc.identifier.pidjungho-
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COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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