Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 안유민 | - |
dc.date.accessioned | 2021-02-18T05:47:24Z | - |
dc.date.available | 2021-02-18T05:47:24Z | - |
dc.date.issued | 2001-02 | - |
dc.identifier.citation | Journal of the Korean Society for Precision Engineering, v. 18, no. 2, page. 54-62 | en_US |
dc.identifier.issn | 1225-9071 | - |
dc.identifier.issn | 2287-8769 | - |
dc.identifier.uri | https://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE00850533? | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/158733 | - |
dc.description.abstract | This paper describes a new method for measuring the changes in specific surface asperities arising from processes such as finishing, coating, wear and corrosion. In repetitive measurements, relocation device gives the same position and orientation so that specific profile can be obtained. A low-cost relocation device is designed and its performance is assessed. The error in relocation process is compensated by statistic compensation algorithm. And, a removing process of cusp by grinding is observed by the proposed method. | en_US |
dc.language.iso | ko_KR | en_US |
dc.publisher | Korean Society for Precision Engineering | en_US |
dc.subject | roughness(표면 거칠기) | en_US |
dc.subject | surface asperities(표면 형상) | en_US |
dc.subject | relocation device(고정 기구) | en_US |
dc.subject | error compensation(오차 보정) | en_US |
dc.title | 가공면의 상태 변화 측정에 관한 연구 | en_US |
dc.title.alternative | A Study on the Measurement of Changes in the Machined Surface | en_US |
dc.type | Article | en_US |
dc.relation.journal | 한국정밀공학회지 | - |
dc.contributor.googleauthor | 조남규 | - |
dc.contributor.googleauthor | 최한광 | - |
dc.contributor.googleauthor | 한창수 | - |
dc.contributor.googleauthor | 안유민 | - |
dc.contributor.googleauthor | 박균명 | - |
dc.relation.code | 2012101691 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DEPARTMENT OF MECHANICAL ENGINEERING | - |
dc.identifier.pid | ahnym | - |
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