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dc.contributor.author김곤호-
dc.date.accessioned2021-02-17T02:43:03Z-
dc.date.available2021-02-17T02:43:03Z-
dc.date.issued2001-04-
dc.identifier.citationJapanese Journal of Applied Physics, v. 40, no. 4R, page. 2506-2507en_US
dc.identifier.issn0021-4922-
dc.identifier.issn1347-4065-
dc.identifier.urihttps://iopscience.iop.org/article/10.1143/JJAP.40.2506/meta-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/158548-
dc.description.abstractUltrashallow p+/n junctions fabricated by plasma source ion implantation (PSII) were studied. After as-implanted samples were spike-annealed at 1000°C and annealed for 5 s at 1000°C, for samples with a background doping concentration of 6×1017 #/cm3, ultrashallow junction depths of 548 Å and 745 Å, respectively, could be obtained with an implant energy of 0.5 keV. Also, sheet resistances of 330 Ω/\Box and 228 Ω/\Box were acquired, respectively. These junction depths and sheet resistances obtained by the PSII process were found to satisfy 0.15 µm metal oxide semiconductor field effect transistor (MOSFET) applications.en_US
dc.language.isoen_USen_US
dc.publisherThe Japan society of Applied Physicsen_US
dc.subjectplasma source ion implantationen_US
dc.subjectultrashallow junctionen_US
dc.subjectjunction depthen_US
dc.subject0.15µm MOSFETen_US
dc.subjectbackground doping concentrationen_US
dc.titlePlasma Source Ion Implantation for Ultrashallow Junctions: Low Energy and High Dose Rateen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.40.2506-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES &-
dc.contributor.googleauthorCho, Jeonghee-
dc.contributor.googleauthorHan, Seunghee-
dc.contributor.googleauthorLee, Yeonhee-
dc.contributor.googleauthorKim, Ok Kyung-
dc.contributor.googleauthorKim, Gon-Ho-
dc.contributor.googleauthorKim, Young-Woo-
dc.contributor.googleauthorLim, Hyuneui-
dc.contributor.googleauthorJung, Hye Sun-
dc.relation.code2012204500-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE & TECHNOLOGY[E]-
dc.sector.departmentDIVISION OF SCIENCE & TECHNOLOGY-
dc.identifier.pidghkim-
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > ETC
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