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dc.contributor.author구자윤-
dc.date.accessioned2021-01-28T07:44:26Z-
dc.date.available2021-01-28T07:44:26Z-
dc.date.issued2002-10-
dc.identifier.citationAnnual Report Conference on Electrical Insulation and Dielectric Phenomena, page. 482-485en_US
dc.identifier.isbn0-7803-7502-5-
dc.identifier.isbn978-0-7803-7502-4-
dc.identifier.urihttps://ieeexplore.ieee.org/document/1048839?arnumber=1048839&SID=EBSCO:edseee-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/157680-
dc.description.abstractIn this work, in order to realize the possible defects at the cable joint interface, four different types of artificial defects are provided such as conducting, insulating substances, void and scratches. And the analysis related to the PD patterns has been performed by means of Phase Resolved Partial Discharge Analysis (PRPDA) and Chaotic Analysis of Partial Discharge (CAPD) as well. The latter has been proposed by our previous communication. As results, it could be pointed out that each defect has shown particular characteristics in its pattern respectively and that the nature of defect causing partial discharge could be identified more distinctively when the CAPD is combined with conventional statistic method, PRPDA.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.titleAn analysis of the partial discharge pattern related to the artificial defects introduced at the interface in XLPE cable joint using laboratory modelen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/CEIDP.2002.1048839-
dc.contributor.googleauthorLee, J.S.-
dc.contributor.googleauthorKoo, J.Y.-
dc.contributor.googleauthorLim, Y.S.-
dc.contributor.googleauthorKim, J.T.-
dc.contributor.googleauthorLee, S.K.-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidkoojy-
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COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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