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dc.contributor.author안강호-
dc.date.accessioned2020-12-31T02:58:06Z-
dc.date.available2020-12-31T02:58:06Z-
dc.date.issued2003-12-
dc.identifier.citation대한기계학회논문집 B권, v. 27, no. 12, page. 1766-1771en_US
dc.identifier.issn2288-5234-
dc.identifier.issn1226-4881-
dc.identifier.urihttp://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE00530795-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/156556-
dc.description.abstractHouse made differential mobility analyzer(DMA) is calibrated with NIST SRM 1691(300 nm PSL) . Then the particle size and uncertainty for differential mobility analyzer(DMA) using the NIST SRM 1963(100 nm PSL). In result, calibration of prototype DMA is measured using 300 nm NIST SRM 1691, then sheath air flow was corrected 126.67㎤ /s. Corrected sheath air flow is used in uncertainty measurement of prototype DMA. Uncertainty analysis is performed using NIST SRM 1963(100 nm PSL). The experimental result shows that NIST SRM 1963 is measured as 102.17 nm with a type A uncertainty of 0.33 nm.en_US
dc.description.sponsorship본 연구는 두뇌 한국 21 프로젝트와 산업 자원부의 도움을 받았으며 이에 감사드립니다.en_US
dc.language.isoko_KRen_US
dc.publisher대한기계학회en_US
dc.subjectDifferential Mobility Analyzeren_US
dc.subjectUncertaintyen_US
dc.subjectStandard Reference Materialen_US
dc.subjectElectrical Mobilityen_US
dc.subject미분형 전기 이동도 분석기(DMA)en_US
dc.subject불확실도en_US
dc.subject표준입자(SRM)en_US
dc.subject전기 이동도en_US
dc.title100nm NIST 표준입자를 이용한 미분형 전기이동도 분석기의 교정 및 불확실도 측정en_US
dc.title.alternativeCalibration and Uncertainty Measurement of Differential Mobility Analyzer Using 100 nm NIST SRM 1963en_US
dc.typeArticleen_US
dc.relation.journal대한기계학회논문집 B-
dc.contributor.googleauthor이상진-
dc.contributor.googleauthor안진홍-
dc.contributor.googleauthor안강호-
dc.relation.code2012100289-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MECHANICAL ENGINEERING-
dc.identifier.pidkhahn-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MECHANICAL ENGINEERING(기계공학과) > Articles
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