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dc.contributor.author정두석-
dc.date.accessioned2020-09-15T00:57:06Z-
dc.date.available2020-09-15T00:57:06Z-
dc.date.issued2019-09-
dc.identifier.citationIEEE ACCESS, v. 7, Page. 137620-137628en_US
dc.identifier.issn2169-3536-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8843881-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/153903-
dc.description.abstractRecently, resistance switch-based content-addressable memory (RCAM) has been proposed as an alternative to the mainstream static random-access memory-based CAM because of its high integration potential and low static energy consumption. However, RCAM has a lower data density due to the use of a pair of resistance switches for a single bit of contents (0.5 bit/switch) than resistive random access memory (1 bit/switch). In this paper, we propose a new type of RCAM referred to as combination-encoding CAM (CECAM). In the N-CECAM, a single unit consists of N high and N low resistance state switches whose combination collectively represents binary contents, yielding a data density of approximately 0.85 bit/switch when N = 10, for instance. The key to the CECAM is the encoding of an n-bit search key as a 2N-digit key and its decoding. To this end, we propose a simple algorithm for encoding and decoding and its implementation in digital circuitry.en_US
dc.description.sponsorshipThis work was supported by the research grant of the National Research Foundation of Korea under Grant NRF-2019R1C1C1009810.en_US
dc.language.isoenen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectContent-addressable memoryen_US
dc.subjectcombination-encoding content-addressable memoryen_US
dc.subjectresistance switchen_US
dc.subjectcrossbar arrayen_US
dc.subjectcontent densityen_US
dc.titleCombination-Encoding Content-Addressable Memory With High Content Densityen_US
dc.typeArticleen_US
dc.relation.volume7-
dc.identifier.doi10.1109/ACCESS.2019.2942150-
dc.relation.page137620-137628-
dc.relation.journalIEEE ACCESS-
dc.contributor.googleauthorKim, Guhyun-
dc.contributor.googleauthorKornijcuk, Vladimir-
dc.contributor.googleauthorKim, Jeeson-
dc.contributor.googleauthorKim, Dohun-
dc.contributor.googleauthorHwang, Cheol Seong-
dc.contributor.googleauthorJeong, Doo Seok-
dc.relation.code2019036307-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.piddooseokj-
dc.identifier.orcidhttps://orcid.org/0000-0001-7954-2213-


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