Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최병덕 | - |
dc.date.accessioned | 2020-07-28T06:13:38Z | - |
dc.date.available | 2020-07-28T06:13:38Z | - |
dc.date.issued | 2019-06 | - |
dc.identifier.citation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 19, no. 3, Page. 260-269 | en_US |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.issn | 2233-4866 | - |
dc.identifier.uri | http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE08746100&language=ko_KR | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/151916 | - |
dc.description.abstract | Invasive physical attacks on integrated circuits (ICs), such as de-packaging, focused ion beam (FIB) chip editing, and micro-probing attempts, constitute security threats for chips with potentially valuable information, such as smart cards. Using a state-of-the-art circuit-editing technique, an attacker can remove an IC's top metal layer, leaving its secure information exposed to micro-probing attacks. Security ICs can be seriously threatened by such attacks and thus require on-chip countermeasures. Conventional active shields, however, have difficulty coping with physical attacks based on FIB chip editing (i.e., bypassing the top metal shield). This study presents a novel countermeasure against physical attacks based on the use of a reconfigurable metal shield for both top metal removal and micro-probing attack detection. This shield consists of two circuits: an FIB chip editing detection circuit consisting of a random number generator and a micro-probing attempt detection circuit consisting of two conditionally synchronized ring oscillators. Both circuits share a randomly reconfigured top metal shield, which represents a promising solution for security against state-of-the-art invasive attacks. | en_US |
dc.description.sponsorship | This work was supported by Samsung Research Funding Center of Samsung Electronics under Project Number SRFC-IT1601-01. This research was also supported by IDEC. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEK PUBLICATION CENTER | en_US |
dc.subject | Terms-Active shield | en_US |
dc.subject | hardware security | en_US |
dc.subject | invasive attack | en_US |
dc.subject | micro-probing attempt | en_US |
dc.subject | top metal shield | en_US |
dc.title | Secure Integrated Circuit with Physical Attack Detection based on Reconfigurable Top Metal Shield | en_US |
dc.type | Article | en_US |
dc.relation.no | 3 | - |
dc.relation.volume | 19 | - |
dc.identifier.doi | 10.5573/JSTS.2019.19.3.260 | - |
dc.relation.page | 260-269 | - |
dc.relation.journal | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.contributor.googleauthor | Mun, Yeongjin | - |
dc.contributor.googleauthor | Kim, Hyungseup | - |
dc.contributor.googleauthor | Lee, Byeoncheol | - |
dc.contributor.googleauthor | Han, Kwonsang | - |
dc.contributor.googleauthor | Kim, Jaesung | - |
dc.contributor.googleauthor | Kim, Ji-Hoon | - |
dc.contributor.googleauthor | Choi, Byong-Deok | - |
dc.contributor.googleauthor | Kim, Dong Kyue | - |
dc.contributor.googleauthor | Ko, Hyoungho | - |
dc.relation.code | 2019038164 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | bdchoi | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.