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dc.contributor.author신동수-
dc.date.accessioned2020-07-02T05:54:45Z-
dc.date.available2020-07-02T05:54:45Z-
dc.date.issued2004-08-
dc.identifier.citation학술대회논문집, Page. 951-954en_US
dc.identifier.urihttps://www.koreascience.or.kr/article/CFKO200424282626178.page-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/151649-
dc.description.abstractWe report the recent reliability test results of SpatiaLight's liquid crystal on Silicon (LCOS) microdisplays. Two different types of reliability tests have been performed: 1) thermal and 2) thermal with high intensity UV light. Various important device parameters were regularly monitored including the contrast ratio, color uniformity, and switching time. The test data shows that there are no degradations that fail the pass criteria. Lifetime estimations are given from the test data.en_US
dc.language.isoenen_US
dc.publisher한국정보디스플레이학회en_US
dc.titleReliability tests on SpatiaLight`s LCOS microdisplaysen_US
dc.typeArticleen_US
dc.contributor.googleauthorSun, Raymond-
dc.contributor.googleauthorJin, Michael-
dc.contributor.googleauthorShin, Dong-Soo-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF PHOTONICS AND NANOELECTRONICS-
dc.identifier.piddsshin-


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