Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 배석주 | - |
dc.date.accessioned | 2020-04-08T07:52:55Z | - |
dc.date.available | 2020-04-08T07:52:55Z | - |
dc.date.issued | 2019-03 | - |
dc.identifier.citation | RELIABILITY ENGINEERING & SYSTEM SAFETY, v. 183, Page. 226-239 | en_US |
dc.identifier.issn | 0951-8320 | - |
dc.identifier.issn | 1879-0836 | - |
dc.identifier.uri | https://www.sciencedirect.com/science/article/pii/S095183201831233X?via%3Dihub | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/148398 | - |
dc.description.abstract | Reliability demonstration tests (RDTs) have been widely adopted to verify reliability requirements of manufacturing products. In practice, due to the limited resource and tight development schedule for new products, it is preferable to determine the decision variables including the termination time and the sample size for the RDT in advance. Existing degradation models often fail to capture the nonlinear degradation characteristics of testing items with complicated degradation mechanisms. This paper proposes a reliability demonstration method using an accelerated degradation test (ADT) in the context of a nonlinear random-coefficients model. First, we present the capabilities of the proposed ADT model to degradation data. Then, the cost-effective RDT plan is derived based on two types of decision risks and reliability requirements from both producers and customers, while meeting certain testing time constraints. The proposed method is illustrated using two practical examples. Finally, sensitivity analysis is provided to evaluate the robustness of the proposed RDT plan using ADT data. | en_US |
dc.description.sponsorship | The authors are greatly grateful to three referees for their careful reading and helpful suggestions. This research was supported by Basic Science Research Program through the National Research Foundation of Korea(NRF) funded by the Ministry of Education(grant number: 2017R1D1A1B03032543). S. J. Bae's work was supported by the Human Resources Program in Energy Technology of the Korea Institute of Energy Technology Evaluation and Planning (KETEP), granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea. (No. 20154030200900), and Leading Core Technology Program sponsored by Defense Acquisition Program Administration and Agency for Defense Development under the project title "High-Performance PMD Technology for Guided Missiles". | en_US |
dc.language.iso | en | en_US |
dc.publisher | ELSEVIER SCI LTD | en_US |
dc.subject | Degradation model | en_US |
dc.subject | Light-emitting diode (LED) | en_US |
dc.subject | Nonlinear random-coefficients model | en_US |
dc.subject | Operating characteristic (OC) curve | en_US |
dc.subject | Wiener process | en_US |
dc.title | A cost-driven reliability demonstration plan based on accelerated degradation tests | en_US |
dc.type | Article | en_US |
dc.relation.volume | 183 | - |
dc.identifier.doi | 10.1016/j.ress.2018.11.017 | - |
dc.relation.page | 226-239 | - |
dc.relation.journal | RELIABILITY ENGINEERING & SYSTEM SAFETY | - |
dc.contributor.googleauthor | Kim, Seong-Joon | - |
dc.contributor.googleauthor | Mun, Byeong Min | - |
dc.contributor.googleauthor | Bae, Suk Joo | - |
dc.relation.code | 2019001970 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF INDUSTRIAL ENGINEERING | - |
dc.identifier.pid | sjbae | - |
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