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dc.contributor.author배석주-
dc.date.accessioned2020-04-08T07:52:55Z-
dc.date.available2020-04-08T07:52:55Z-
dc.date.issued2019-03-
dc.identifier.citationRELIABILITY ENGINEERING & SYSTEM SAFETY, v. 183, Page. 226-239en_US
dc.identifier.issn0951-8320-
dc.identifier.issn1879-0836-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S095183201831233X?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/148398-
dc.description.abstractReliability demonstration tests (RDTs) have been widely adopted to verify reliability requirements of manufacturing products. In practice, due to the limited resource and tight development schedule for new products, it is preferable to determine the decision variables including the termination time and the sample size for the RDT in advance. Existing degradation models often fail to capture the nonlinear degradation characteristics of testing items with complicated degradation mechanisms. This paper proposes a reliability demonstration method using an accelerated degradation test (ADT) in the context of a nonlinear random-coefficients model. First, we present the capabilities of the proposed ADT model to degradation data. Then, the cost-effective RDT plan is derived based on two types of decision risks and reliability requirements from both producers and customers, while meeting certain testing time constraints. The proposed method is illustrated using two practical examples. Finally, sensitivity analysis is provided to evaluate the robustness of the proposed RDT plan using ADT data.en_US
dc.description.sponsorshipThe authors are greatly grateful to three referees for their careful reading and helpful suggestions. This research was supported by Basic Science Research Program through the National Research Foundation of Korea(NRF) funded by the Ministry of Education(grant number: 2017R1D1A1B03032543). S. J. Bae's work was supported by the Human Resources Program in Energy Technology of the Korea Institute of Energy Technology Evaluation and Planning (KETEP), granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea. (No. 20154030200900), and Leading Core Technology Program sponsored by Defense Acquisition Program Administration and Agency for Defense Development under the project title "High-Performance PMD Technology for Guided Missiles".en_US
dc.language.isoenen_US
dc.publisherELSEVIER SCI LTDen_US
dc.subjectDegradation modelen_US
dc.subjectLight-emitting diode (LED)en_US
dc.subjectNonlinear random-coefficients modelen_US
dc.subjectOperating characteristic (OC) curveen_US
dc.subjectWiener processen_US
dc.titleA cost-driven reliability demonstration plan based on accelerated degradation testsen_US
dc.typeArticleen_US
dc.relation.volume183-
dc.identifier.doi10.1016/j.ress.2018.11.017-
dc.relation.page226-239-
dc.relation.journalRELIABILITY ENGINEERING & SYSTEM SAFETY-
dc.contributor.googleauthorKim, Seong-Joon-
dc.contributor.googleauthorMun, Byeong Min-
dc.contributor.googleauthorBae, Suk Joo-
dc.relation.code2019001970-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF INDUSTRIAL ENGINEERING-
dc.identifier.pidsjbae-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > INDUSTRIAL ENGINEERING(산업공학과) > Articles
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