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dc.contributor.author심종인-
dc.date.accessioned2020-03-23T06:07:56Z-
dc.date.available2020-03-23T06:07:56Z-
dc.date.issued2004-04-
dc.identifier.citationIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v. 12, No. 4, Page. 395-407en_US
dc.identifier.issn1063-8210-
dc.identifier.issn1557-9999-
dc.identifier.urihttps://ieeexplore.ieee.org/document/1288176/authors-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/139362-
dc.description.abstractNovel signal integrity verification models and algorithms for inductance-effect-prominent RLC interconnect lines are developed by using a traveling-wave-based waveform approximation (TWA) technique. The multicoupled line responses are decoupled into the eigenmodes of the system in order to exploit the TWA technique. Then, the response signals are mathematically represented by the linear combination of each eigenmode response based on TWA, followed by reporting the signal integrity models and algorithms for the multicoupled lines. The signal integrity of VLSI circuit interconnects is complicatedly correlated with input signal switching-patterns, layout geometry, and termination conditions. It is shown that the technique can be efficiently employed for complicated multicoupled interconnect lines with various termination conditions and the signal transients based on the technique have excellent agreement with SPICE simulations. Thus, with the proposed technique, the switching-dependent signal delay, crosstalk, ringing, and glitches of the inductance-effect-prominent RLC interconnect lines can be accurately as well as efficiently determined.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.subjectCrosstalken_US
dc.subjectdelayen_US
dc.subjectglitchen_US
dc.subjectringingen_US
dc.subjectsignal integrityen_US
dc.subjecttransmission lineen_US
dc.subjecttraveling-waveen_US
dc.subjecttraveling-wave-based waveform approximation (TWA)en_US
dc.subjectvery large scale integration (VLSI) interconnectsen_US
dc.subjectLOSSY TRANSMISSION-LINESen_US
dc.subjectFREQUENCY-DEPENDENT PARAMETERSen_US
dc.subjectSPEED INTEGRATED-CIRCUITSen_US
dc.subjectFORM RELAXATION ANALYSISen_US
dc.subjectTRANSIENT SIMULATIONen_US
dc.subjectEXPRESSIONSen_US
dc.subjectNETWORKSen_US
dc.subjectDESIGNen_US
dc.titleAnalytical Models and Algorithms for the Efficient Signal Integrity Verification of Inductance-Effect-Prominent Multicoupled VLSI Circuit Interconnectsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TVLSI.2004.825836-
dc.relation.journalIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-
dc.contributor.googleauthorShin, Seongkyun-
dc.contributor.googleauthorEo, Yungseon-
dc.contributor.googleauthorEisenstadt, William R.-
dc.contributor.googleauthorShim, Jongin-
dc.relation.code2009203903-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF PHOTONICS AND NANOELECTRONICS-
dc.identifier.pidjishim-


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