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dc.contributor.author안진호-
dc.date.accessioned2019-12-08T07:14:57Z-
dc.date.available2019-12-08T07:14:57Z-
dc.date.issued2018-06-
dc.identifier.citationCOLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, v. 555, page. 72-79en_US
dc.identifier.issn0927-7757-
dc.identifier.issn1873-4359-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S092777571830582X?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/118984-
dc.description.abstractUnder extreme ultraviolet (EUV) exposure, the surfaces of EUV mask and optics are exposed to hydrocarbon contaminant, which reduces the imaging performance and lifetime of EUV mask. Thus, an efficient method is required to remove hydrocarbon contaminant from the mask surface. In this work, a mixture of alkaline chemicals and organic solvents has been proposed for the removal of EUV exposed hydrocarbon contaminant from Ru (Ruthenium) capping layer of EUV mask. A hydrocarbon film with similar properties to EUV hydrocarbon contaminant was prepared by PECVD (plasma enhanced chemical vapor deposition). The hydrocarbon removal efficiency was evaluated by using four kinds of quaternary ammonium hydroxides as alkaline chemicals, and DMSO (dimethyl sulfoxide) and THE (tetrahydrofuran) as polar aprotic organic solvents. Among the alkaline chemicals, tetrabutyl ammonium hydroxide, together with an organic solvent, produced effective removal of hydrocarbon from Ru. Removal of hydrocarbon film using a higher polar organic DMSO solvent required a higher concentration and longer time than THF. The combination of megasonic power and cleaning chemistry enhanced the hydrocarbon removal efficiency significantly.en_US
dc.description.sponsorshipThis work was supported by the Future Semiconductor Device Technology Development Program#10045366 funded by MOTIE (Ministry of Trade, Industry & Energy) and KSRC (Korea Semiconductor Research Consortium).en_US
dc.language.isoen_USen_US
dc.publisherELSEVIER SCIENCE BVen_US
dc.subjectHydrocarbon contaminanten_US
dc.subjectCleaningen_US
dc.subjectRuthenium surfaceen_US
dc.subjectMegasonic cleaningen_US
dc.titleRemoval of EUV exposed hydrocarbon from Ru capping layer of EUV mask using the mixture of alkaline solutions and organic solventsen_US
dc.typeArticleen_US
dc.relation.volume555-
dc.identifier.doi10.1016/j.colsurfa.2018.06.067-
dc.relation.page72-79-
dc.relation.journalCOLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS-
dc.contributor.googleauthorKim, Min-Su-
dc.contributor.googleauthorPurushothaman, Muthukrishnan-
dc.contributor.googleauthorKim, Hyun-Tae-
dc.contributor.googleauthorSong, Hee-Jin-
dc.contributor.googleauthorKim, Young-Woong-
dc.contributor.googleauthorAhn, Jin-Ho-
dc.contributor.googleauthorOh, Hye-Keun-
dc.contributor.googleauthorPark, Jin-Goo-
dc.relation.code2018002025-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidjhahn-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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