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dc.contributor.author배석주-
dc.date.accessioned2019-12-05T18:23:57Z-
dc.date.available2019-12-05T18:23:57Z-
dc.date.issued2018-03-
dc.identifier.citation신뢰성 응용연구, v. 18, no. 1, page. 33-39en_US
dc.identifier.issn1738-9895-
dc.identifier.urihttp://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE07408860&language=ko_KR-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/117720-
dc.description.abstractPurpose: Accelerated degradation tests can be effective in assessing product reliability when degradation leading to failure can be observed. This article proposes an accelerated degradation test model for highly reliable solid state drives (SSDs).Methods: We suggest a nonlinear mixed-effects (NLME) model to degradation data for SSDs. A Monte Carlo simulation is used to estimate lifetime distribution in accelerated degradation testing data. This simulation is performed by generating random samples from the assumed NLME model.Conclusion: We apply the proposed method to degradation data collected from SSDs. The derived power model is shown to be much better at fitting the degradation data than other existing models. Finally, the Monte Carlo simulation based on the NLME model provides reasonable results in lifetime estimation.en_US
dc.language.isoko_KRen_US
dc.publisher한국신뢰성학회en_US
dc.subjectAccelerated Degradation Testen_US
dc.subjectDegradation Modelen_US
dc.subjectNon-Linear Mixed-Effects Modelen_US
dc.subjectRaw Bit Error Rateen_US
dc.subjectSolid State Driveen_US
dc.titleSolid State Drive(SSD)에 대한 가속열화시험 데이터 모델링 및 분석en_US
dc.title.alternativeModeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD)en_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume18-
dc.identifier.doi10.33162/JAR.2018.03.18.1.33-
dc.relation.page33-39-
dc.relation.journal신뢰성 응용연구-
dc.contributor.googleauthor문병민-
dc.contributor.googleauthor최영진-
dc.contributor.googleauthor지유민-
dc.contributor.googleauthor이용중-
dc.contributor.googleauthor이근우-
dc.contributor.googleauthor나한주-
dc.contributor.googleauthor양중섭-
dc.contributor.googleauthor배석주-
dc.contributor.googleauthorMun, Byeong Min-
dc.contributor.googleauthorChoi, Young Jin-
dc.contributor.googleauthorJi, You Min-
dc.contributor.googleauthorLee, Yong Jung-
dc.contributor.googleauthorLee, Keun Woo-
dc.contributor.googleauthorNa, Han Joo-
dc.contributor.googleauthorYang, Joong Seob-
dc.contributor.googleauthorBae, Suk Joo-
dc.relation.code2018019273-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF INDUSTRIAL ENGINEERING-
dc.identifier.pidsjbae-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > INDUSTRIAL ENGINEERING(산업공학과) > Articles
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