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dc.contributor.author김태환-
dc.date.accessioned2019-12-04T00:31:05Z-
dc.date.available2019-12-04T00:31:05Z-
dc.date.issued2018-01-
dc.identifier.citationAPPLIED SURFACE SCIENCE, v. 429, page. 231-236en_US
dc.identifier.issn0169-4332-
dc.identifier.issn1873-5584-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0169433217324522?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/116917-
dc.description.abstractCurrent-voltage (I-V) curves for the Al/polymer (9-vinylcarbazole) (PVK)/graphene oxide (GO):mica/PVK/indium-tin oxide (ITO) devices at 300K showed a current bistability with a maximum high conductivity (ON)/low conductivity (OFF) ratio of 2 x 10(4), which was approximately 10 times larger than that of the device without a PVK layer. The endurance number of ON/OFF switchings for the Al/PVK/GO:mica/PVK/ITO device was 1 x 10(2) cycles, which was 20 times larger than that for the Al/GO:mica/ITO device. The "erase" voltages were distributed between 2.3 and 3V, and the "write" voltages were distributed between -1.2 and -0.5 V. The retention time for the Al/PVK/GO:mica/PVK/ITO device was above 1 x 10(4) s, indicative of the memory stability of the device. The carrier transport mechanisms occurring in the Al/PVK/GO:mica/PVK/ITO and the Al/GO:mica/ITO devices are described on the basis of the I-V results and the energy band diagrams. (C) 2017 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipThis research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2016R1A2A1A05005502).en_US
dc.language.isoen_USen_US
dc.publisherELSEVIER SCIENCE BVen_US
dc.subjectGraphene oxideen_US
dc.subjectMicaen_US
dc.subjectPVKen_US
dc.subjectNanocompositeen_US
dc.subjectOrganic bistable deviceen_US
dc.titleEnhancements of the memory margin and the stability of an organic bistable device due to a graphene oxide:mica nanocomposite sandwiched between two polymer (9-vinylcarbazole) buffer layersen_US
dc.typeArticleen_US
dc.relation.volume429-
dc.identifier.doi10.1016/j.apsusc.2017.08.105-
dc.relation.page231-236-
dc.relation.journalAPPLIED SURFACE SCIENCE-
dc.contributor.googleauthorKim, Woo Kyum-
dc.contributor.googleauthorWu, Chaoxing-
dc.contributor.googleauthorLee, Dea Uk-
dc.contributor.googleauthorKim, Hyoun Woo-
dc.contributor.googleauthorKim, Tae Whan-
dc.relation.code2018002021-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidtwk-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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