Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bukhvalov Danil | - |
dc.date.accessioned | 2019-12-03T02:19:35Z | - |
dc.date.available | 2019-12-03T02:19:35Z | - |
dc.date.issued | 2017-12 | - |
dc.identifier.citation | APPLIED SURFACE SCIENCE, v. 426, page. 1167-1172 | en_US |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.issn | 1873-5584 | - |
dc.identifier.uri | https://www.sciencedirect.com/science/article/pii/S0169433217322791?via%3Dihub | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/116703 | - |
dc.description.abstract | We report the results of X-ray spectroscopy and Raman measurements of as-prepared graphene on a high quality copper surface and the same materials after 1.5 years under different conditions (ambient and low humidity). The obtained results were compared with density functional theory calculations of the formation energies and electronic structures of various structural defects in graphene/Cu interfaces. For evaluation of the stability of the carbon cover, we propose a two-step model. The first step is oxidation of the graphene, and the second is perforation of graphene with the removal of carbon atoms as part of the carbon dioxide molecule. Results of the modeling and experimental measurements provide evidence that graphene grown on high-quality copper substrate becomes robust and stable in time (1.5 years). However, the stability of this interface depends on the quality of the graphene and the number of native defects in the graphene and substrate. The effect of the presence of a metallic substrate with defects on the stability and electronic structure of graphene is also discussed. | en_US |
dc.description.sponsorship | XPS measurements were supported by the Russian Science Foundation (Project 14-22-00004). D.W.B. acknowledges support from the Ministry of Education and Science of the Russian Federation, Project No 3.7372.2017. S.O.C. acknowledges the support of the Government of the Russian Federation (Act 211, agreement No 02.A03.21.0006). G.S.C gratefully acknowledges the support of the Natural Sciences and Engineering Research Council of Canada (NSERC) and the Canada Foundation for Innovation (CFI). Research described in this paper was performed at the Canadian Light Source, which is funded by the Canada Foundation for Innovation, the Natural Sciences and Engineering Research Council of Canada, the National Research Council Canada, the Canadian Institutes of Health Research, the Government of Saskatchewan, Western Economic Diversification Canada, and the University of Saskatchewan. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | ELSEVIER SCIENCE BV | en_US |
dc.subject | Graphene | en_US |
dc.subject | Corrosion barrier | en_US |
dc.subject | X-ray spectroscopy | en_US |
dc.subject | Oxidation | en_US |
dc.subject | DFT modeling | en_US |
dc.title | Atomic and electronic structure of a copper/graphene interface as prepared and 1.5 years after | en_US |
dc.type | Article | en_US |
dc.relation.volume | 426 | - |
dc.identifier.doi | 10.1016/j.apsusc.2017.07.279 | - |
dc.relation.page | 1167-1172 | - |
dc.relation.journal | APPLIED SURFACE SCIENCE | - |
dc.contributor.googleauthor | Boukhvalov, D. W. | - |
dc.contributor.googleauthor | Bazylewski, P. F. | - |
dc.contributor.googleauthor | Kukharenko, A. I. | - |
dc.contributor.googleauthor | Zhidkov, I. S. | - |
dc.contributor.googleauthor | Ponosov, Yu. S. | - |
dc.contributor.googleauthor | Kurmaev, E. Z. | - |
dc.contributor.googleauthor | Cholakh, S. O. | - |
dc.contributor.googleauthor | Lee, Y. H. | - |
dc.contributor.googleauthor | Chang, G. S. | - |
dc.relation.code | 2017001946 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF NATURAL SCIENCES[S] | - |
dc.sector.department | DEPARTMENT OF CHEMISTRY | - |
dc.identifier.pid | danil | - |
dc.identifier.researcherID | F-7517-2017 | - |
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