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dc.contributor.author송윤흡-
dc.date.accessioned2019-12-01T15:58:37Z-
dc.date.available2019-12-01T15:58:37Z-
dc.date.issued2017-10-
dc.identifier.citationMICROELECTRONICS JOURNAL, v. 68, page. 23-31en_US
dc.identifier.issn0026-2692-
dc.identifier.issn1879-2391-
dc.identifier.urihttps://www.sciencedirect.com/science/article/abs/pii/S0026269217302926?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/115993-
dc.description.abstractBrain-inspired neuromorphic computing systems are receiving significant attention. A typical neuromorphic computing system is the neuron network, whose basic performance is the integrate-and-fire operation. However, latency issues can occur if the integrated signal is not sufficient during the integration process, the integration time is too long, or no firing occurs. In this paper, we propose a dummy cell added neural network to ensure complete I & F operation. The dummy cell compensates the weak signals to ensure a complete I & F operation and to modulate the integration time; but makes negligible influence on the strong signals. The firing rate of a weak signal increases from 80% to 100%. Finally, we analyzed the external area consumption of dummy cells, it can be reduced as small as a few thousandths with large number of input neurons. This proposed scheme can be used in pattern recognition to increase reliability and modulate the integration time.en_US
dc.description.sponsorshipThis work was supported by a National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIP: Ministry of Science, ICT and Future Planning) (NRF-2016M3A7B4910398).en_US
dc.language.isoen_USen_US
dc.publisherELSEVIER SCI LTDen_US
dc.subjectNeural networken_US
dc.subjectIntegrate-and-fireen_US
dc.subjectPattern recognitionen_US
dc.subjectNeuromorphicen_US
dc.titleA Dummy Cell Added Neural Network Using in Pattern Recognition for Prevention of Failed Eventsen_US
dc.typeArticleen_US
dc.relation.volume68-
dc.identifier.doi10.1016/j.mejo.2017.08.013-
dc.relation.page23-31-
dc.relation.journalMICROELECTRONICS JOURNAL-
dc.contributor.googleauthorLi, Cheng-
dc.contributor.googleauthorSong, Yun-Heub-
dc.relation.code2017007744-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidyhsong2008-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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