Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박상규 | - |
dc.date.accessioned | 2019-11-25T21:01:20Z | - |
dc.date.available | 2019-11-25T21:01:20Z | - |
dc.date.issued | 2017-06 | - |
dc.identifier.citation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 17, no. 3, page. 347-353 | en_US |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.issn | 2233-4866 | - |
dc.identifier.uri | http://koreascience.or.kr/article/JAKO201719558339580.page | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/114277 | - |
dc.description.abstract | We present a STT-MRAM read-circuit which mitigates the performance degradation caused by offsets from device mismatches. In the circuit, a single current source supplies read-current to both the data and the reference cells sequentially eliminating potential mismatches. Furthermore, an offset-free pre-amplification using a capacitor storing the mismatch information is employed to lessen the effect of the comparator offset. The proposed circuit was implemented using a 130-nm CMOS technology and Monte Carlo simulations of the circuit demonstrate its effectiveness in suppressing the effect of device mismatch. | en_US |
dc.description.sponsorship | The CAD tools used in this work was supported by IDEC, Korea. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEK PUBLICATION CENTER | en_US |
dc.subject | STT-MRAM | en_US |
dc.subject | read-circuit | en_US |
dc.subject | offset cancellation | en_US |
dc.subject | sensing margin | en_US |
dc.title | STT-MRAM Read-circuit with Improved Offset Cancellation | en_US |
dc.type | Article | en_US |
dc.relation.no | 3 | - |
dc.relation.volume | 17 | - |
dc.identifier.doi | 10.5573/JSTS.2017.17.3.347 | - |
dc.relation.page | 347-353 | - |
dc.relation.journal | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.contributor.googleauthor | Lee, Dong-Gi | - |
dc.contributor.googleauthor | Park, Sang-Gyu | - |
dc.relation.code | 2017011265 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | sanggyu | - |
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