Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권오경 | - |
dc.date.accessioned | 2019-11-20T21:09:11Z | - |
dc.date.available | 2019-11-20T21:09:11Z | - |
dc.date.issued | 2017-02 | - |
dc.identifier.citation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 17, no. 1, page. 29-34 | en_US |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.issn | 2233-4866 | - |
dc.identifier.uri | http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE07118614 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/112850 | - |
dc.description.abstract | A CMOS-based temperature sensor is proposed for low-voltage and low-power on-chip thermal monitoring applications. The proposed temperature sensor converts a proportional to absolute temperature (PTAT) current to a PTAT frequency using an integrator and hysteresis comparator. In addition, it operates in the subthreshold region, allowing reduced power consumption. The proposed temperature sensor was fabricated in a standard 90 nm CMOS technology. Measurement results of the proposed temperature sensor show a temperature error of between -0.81 and + 0.94(circle)C in the temperature range of 0 to 70(circle)C after one-point calibration at 30(circle)C, with a temperature coefficient of 218 Hz/C-circle. Moreover, the measured energy of the proposed temperature sensor is 36 pJ per conversion, the lowest compared to prior works. | en_US |
dc.description.sponsorship | This work was supported by the National Research Council of Science & Technology (NST) grant by the Korea government ( MSIP) (No. CMP-16-05-ETRI). | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IEEK PUBLICATION CENTER | en_US |
dc.subject | Temperature sensor | en_US |
dc.subject | low-voltage low-power | en_US |
dc.subject | subthreshold current | en_US |
dc.subject | PTAT | en_US |
dc.subject | temperature-to-frequency converter | en_US |
dc.title | A CMOS-based Temperature Sensor with Subthreshold Operation for Low-voltage and Low-power On-chip Thermal Monitoring | en_US |
dc.type | Article | en_US |
dc.relation.no | 1 | - |
dc.relation.volume | 17 | - |
dc.identifier.doi | 10.5573/JSTS.2017.17.1.029 | - |
dc.relation.page | 29-34 | - |
dc.relation.journal | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.contributor.googleauthor | Na, Jun-Seok | - |
dc.contributor.googleauthor | Shin, Woosul | - |
dc.contributor.googleauthor | Kwak, Bong-Choon | - |
dc.contributor.googleauthor | Hong, Seong-Kwan | - |
dc.contributor.googleauthor | Kwon, Oh-Kyong | - |
dc.relation.code | 2017011265 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | okwon | - |
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