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dc.contributor.author정진욱-
dc.date.accessioned2019-11-18T08:03:42Z-
dc.date.available2019-11-18T08:03:42Z-
dc.date.issued2017-01-
dc.identifier.citationPHYSICS OF PLASMAS, v. 24, no. 1, Article no. 013508en_US
dc.identifier.issn1070-664X-
dc.identifier.issn1089-7674-
dc.identifier.urihttps://aip.scitation.org/doi/10.1063/1.4972576-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/112223-
dc.description.abstractA floating type Langmuir probe was studied to measure the electron energy distribution function (EEDF) in plasmas. This method measures the current (I)-voltage (V) curve with rising and falling variations based on a floating potential by using charge-discharge characteristics of the series capacitor when a square-pulse voltage is applied. In addition, this method measures the EEDF by using the alternating current (ac) superposition method. The measured EEDFs were in good agreement with results from a conventional single Langmuir probe. This technique could be applied as a plasma diagnostic method in the capacitively coupled plasma where the plasma potential is extremely high or the processing plasma where the deposition gas is used. Published by AIP Publishing.en_US
dc.description.sponsorshipThis work was supported by the National R&D program (NRF-2014M1A7A1A03045185) of the National Research Foundation of Korea, the MOTIE/KSRC support program (10052861) for the development of the future semiconductor device, and the Korea Research Institute of Standard and Science (KRISS) and the R&D Convergence Program (CAP-16-04-KRISS).en_US
dc.language.isoenen_US
dc.publisherAMER INST PHYSICSen_US
dc.subjectDISCHARGEen_US
dc.titlePulsed floating-type Langmuir probe for measurements of electron energy distribution function in plasmasen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume24-
dc.identifier.doi10.1063/1.4972576-
dc.relation.page1-5-
dc.relation.journalPHYSICS OF PLASMAS-
dc.contributor.googleauthorChoi, Ikjin-
dc.contributor.googleauthorKim, Aram-
dc.contributor.googleauthorLee, Hyo-Chang-
dc.contributor.googleauthorKim, Dong-Hwan-
dc.contributor.googleauthorChung, Chin-Wook-
dc.relation.code2017001875-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING-
dc.identifier.pidjoykang-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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