Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정두석 | - |
dc.date.accessioned | 2019-10-14T01:52:22Z | - |
dc.date.available | 2019-10-14T01:52:22Z | - |
dc.date.issued | 2019-04 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v. 66, NO 4, Page. 1717-1721 | en_US |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.issn | 1557-9646 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/8660576 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/111013 | - |
dc.description.abstract | The physical unclonable function (PUF) based on resistive random-access memory (RRAM) possesses a distinctive advantage that can offer higher security and lower cost than the traditional complementary metal-oxide-semiconductor-based Wcryptographic devices and other conventional PUFs. The intrinsic stochasticity of RRAM devices successfully provides attractive properties to implement PUF. In this paper, we present a novel multistate-based RRAM PUF to realize strong tolerance against attack. By applying multilevel states with bit shuffling to the RRAM PUF, the randomness and uniqueness were enhanced close to ideal values. In addition, the bit error rate was dramatically reduced using the temperature compensation mechanism. Moreover, our new method not only enables the generation of larger challenge-response pairs (CRPs) with less footprint but also can reconfigure CRPs. | en_US |
dc.description.sponsorship | This work was supported by the National Research Foundation Program under Grant NRF-2017R1E1A1A01077484. The review of this paper was arranged by Editor U. E. Avci. (Gyo Sub Lee and Gun-Hwan Kim contributed equally to this work.) | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | en_US |
dc.subject | Hardware security | en_US |
dc.subject | multilevel cell (MLC) | en_US |
dc.subject | physical unclonable function (PUF) | en_US |
dc.subject | randomness | en_US |
dc.subject | reliability | en_US |
dc.subject | resistive random-access memory (RRAM) | en_US |
dc.subject | uniqueness | en_US |
dc.title | Enhanced Reconfigurable Physical Unclonable Function Based on Stochastic Nature of Multilevel Cell RRAM | en_US |
dc.type | Article | en_US |
dc.relation.no | 4 | - |
dc.relation.volume | 66 | - |
dc.identifier.doi | 10.1109/TED.2019.2898455 | - |
dc.relation.page | 1717-1721 | - |
dc.relation.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.contributor.googleauthor | Lee, Gyo Sub | - |
dc.contributor.googleauthor | Kim, Gun-Hwan | - |
dc.contributor.googleauthor | Kwak, Kisung | - |
dc.contributor.googleauthor | Jeong, Doo Seok | - |
dc.contributor.googleauthor | Ju, Hyunsu | - |
dc.relation.code | 2019000238 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DIVISION OF MATERIALS SCIENCE AND ENGINEERING | - |
dc.identifier.pid | dooseokj | - |
dc.identifier.researcherID | Y-3664-2019 | - |
dc.identifier.orcid | http://orcid.org/0000-0001-7954-2213 | - |
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