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dc.contributor.author김진오-
dc.date.accessioned2019-10-10T01:02:54Z-
dc.date.available2019-10-10T01:02:54Z-
dc.date.issued2019-04-
dc.identifier.citation조명.전기설비학회논문지, v. 33, NO 4, Page. 56-65en_US
dc.identifier.issn1229-4691-
dc.identifier.issn2287-5034-
dc.identifier.urihttp://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE08007303&language=ko_KR-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/110934-
dc.description.abstractArcflash accident takes approximately 40% of entire domestic accident. The problem with arcflash accidents is that when the duration of arc increases, the size of arcflash accidents increases. When arc occurs, the electrical characteristics change depending on the type of load, such as frequency, voltage, and current. Most of arc detection methods are based on using characteristic changes such as voltage, current in high frequency band. So when arcflash accident occurs, the most important part is to detect arc and generate trip signal immediately. Moreover, arc detection system should be precise not to affect normal operation. In this study, we propose a method for high speed detection with combining detection of specific wave length of UV ray and high frequency component of arc. The proposed system is configured to distinguish arc with its UV wave length and high frequency component then generate a trip signal. Conventional arc protection system has intrinsic delay time not to affect normal operation. The proposed system can minize that delay time to generate trip signal compared to conventional system.en_US
dc.description.sponsorshipThis research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No.NRF2017R1A2B1007520).en_US
dc.language.isoko_KRen_US
dc.publisher한국조명.전기설비학회en_US
dc.subjectArcflashen_US
dc.subjectArcflash UV Detectionen_US
dc.subjectArc High-Speed Detectionen_US
dc.title아크플래시로 인한 사고를 줄이기 위해 아크의 자외선 파장과 노이즈 검출en_US
dc.title.alternativeReducing Damage from Arc-Flash Accident with Ultraviolet Wavelength and Noise Detectionen_US
dc.typeArticleen_US
dc.relation.no4-
dc.relation.volume33-
dc.identifier.doi10.5207/JIEIE.2019.33.4.056-
dc.relation.page56-65-
dc.relation.journal조명.전기설비학회논문지-
dc.contributor.googleauthor임대식-
dc.contributor.googleauthor김진오-
dc.contributor.googleauthorLim, Dae-Sik-
dc.contributor.googleauthorKim, Jin-O-
dc.relation.code2019035126-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING-
dc.identifier.pidjokim-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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