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dc.contributor.author김진오-
dc.date.accessioned2019-08-22T01:07:40Z-
dc.date.available2019-08-22T01:07:40Z-
dc.date.issued2019-03-
dc.identifier.citationENERGIES, v. 12, NO 6, 1115en_US
dc.identifier.issn1996-1073-
dc.identifier.urihttps://www.mdpi.com/1996-1073/12/6/1115-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/108888-
dc.description.abstractA waveform contains recognizable feature patterns. To extract the features of various equipment disturbance conditions from a waveform, this paper presents a practical model to estimate distribution line (DL) conditions by means of a multi-label extreme learning machine. The motivation for the waveform learning is to develop device-embedded models which are capable of detecting and classifying abnormal operations on the DLs. In waveform analysis, power quality waveform modeling criteria are adopted for pattern classification. Typical disturbance waveforms are applied as class models, and the formula-generated waveform features are compared with field-acquired waveforms for disturbance classification. In particular, filtered symmetrical components of the modified varying window scale are applied for feature extraction. The proposed model interacts suitably with the parameter update method in classifying the waveforms in real network situations. The classification result showed disturbance features on model with the real DL waveform data holds a potential for determining additional DL conditions and improving its classification performance through the update mechanism of the learning machine.en_US
dc.description.sponsorshipThis research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. NRF-2017R1A2B1007520).en_US
dc.language.isoenen_US
dc.publisherMDPIen_US
dc.subjectcondition monitoringen_US
dc.subjectfeature learningen_US
dc.subjectpower qualityen_US
dc.subjectwaveform analyticsen_US
dc.subjectdisturbance detectionen_US
dc.titleMulti-Labeled Recognition of Distribution System Conditions by a Waveform Feature Learning Modelen_US
dc.typeArticleen_US
dc.relation.no6-
dc.relation.volume12-
dc.identifier.doi10.3390/en12061115-
dc.relation.page1-14-
dc.relation.journalENERGIES-
dc.contributor.googleauthorMoon, Sang-Keun-
dc.contributor.googleauthorKim, Jin-O-
dc.contributor.googleauthorKim, Charles-
dc.relation.code2019037058-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING-
dc.identifier.pidjokim-


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