Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 어영선 | - |
dc.date.accessioned | 2019-07-17T06:43:03Z | - |
dc.date.available | 2019-07-17T06:43:03Z | - |
dc.date.issued | 2007-12 | - |
dc.identifier.citation | Journal of Semiconductor Technology and Science, v. 7, No. 4, Page. 260 - 266 | en_US |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.uri | http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE01026116&language=ko_KR | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/107542 | - |
dc.description.abstract | Analytical compact form models for the signal transients and crosstalk noise of inductiveeffect-prominent multi-coupled RLC lines are developed. Capacitive and inductive coupling effects are investigated and formulated in terms of the equivalent transmission line model and transmission line parameters for fundamental modes. The signal transients and crosstalk noise expressions of two coupled lines are derived by using a waveform approximation technique. It is shown that the models have excellent agreement with SPICE simulation. | en_US |
dc.language.iso | ko_KR | en_US |
dc.publisher | 대한전자공학회 | en_US |
dc.subject | Crosstalk | en_US |
dc.subject | inductance effect | en_US |
dc.subject | interconnect lines | en_US |
dc.subject | signal transient | en_US |
dc.subject | transmission lines | en_US |
dc.title | Signal transient and crosstalk model of capacitively and inductively coupled VLSI interconnect lines | en_US |
dc.type | Article | en_US |
dc.relation.journal | 전자공학회논문지 | - |
dc.contributor.googleauthor | Kim, Taehoon | - |
dc.contributor.googleauthor | Kim, Dongchul | - |
dc.contributor.googleauthor | Eo, Yungseon | - |
dc.relation.code | 2012210989 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
dc.sector.department | DIVISION OF ELECTRICAL ENGINEERING | - |
dc.identifier.pid | eo | - |
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