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dc.contributor.author박현석-
dc.date.accessioned2019-05-29T01:15:49Z-
dc.date.available2019-05-29T01:15:49Z-
dc.date.issued2019-01-
dc.identifier.citationIEEE ACCESS, v. 7, Page. 8135-8150en_US
dc.identifier.issn2169-3536-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8605517-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/106135-
dc.description.abstractThe aim of this paper is to develop and test the metrics to quantitatively identify technological discontinuities in a knowledge network. We first analyzed the various conceptual frameworks for defining such discontinuities and arrived at four metrics. We tested the four metrics: Metric 1 and 2 are the normalized versions of previously existing metrics and Metric 3 and 4 are newly developed from the innovation theories, by using a patent set representative of the magnetic information storage domain The three representative patents associated with a well-known breakthrough technology in the domain, the giant magneto-resistance spin valve sensor, were selected based on qualitative studies, and the metrics were tested by how well each identifies the selected patents as top-ranked patents. The empirical results show that, first, global citation structure-based metrics clearly provide better performance in the identification of technological discontinuities than local citation count-based metrics which have not been shown as clearly before, second, non-continuous nodes on the major knowledge networks are not at all related to technological discontinuities, and, third, the two global metrics (Metric2: z-score of Persistence and Metric 4: z-score of Persistence times # of converging main paths) successfully identified the three selected patents as top-ranked patents out of over 30 000 patents.en_US
dc.description.sponsorshipThis work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning under Grant 2017R1A2B4012431 and in part by the SUTD-MIT International Design Center.en_US
dc.language.isoenen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectKnowledge discontinuityen_US
dc.subjectquantitative simulationen_US
dc.subjectknowledge networksen_US
dc.subjectpatent citation networksen_US
dc.titleQuantitative Identification of Technological Discontinuitiesen_US
dc.typeArticleen_US
dc.relation.volume7-
dc.identifier.doi10.1109/ACCESS.2018.2890372-
dc.relation.page8135-8150-
dc.relation.journalIEEE ACCESS-
dc.contributor.googleauthorPark, Hyunseok-
dc.contributor.googleauthorMagee, Christopher L.-
dc.relation.code2019036307-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF INFORMATION SYSTEMS-
dc.identifier.pidhp-
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COLLEGE OF ENGINEERING[S](공과대학) > INFORMATION SYSTEMS(정보시스템학과) > Articles
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