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dc.contributor.author최성철-
dc.date.accessioned2019-03-19T06:31:00Z-
dc.date.available2019-03-19T06:31:00Z-
dc.date.issued2016-11-
dc.identifier.citationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v. 16, NO. 11, Page. 11330-11334en_US
dc.identifier.issn1533-4880-
dc.identifier.issn1533-4899-
dc.identifier.urihttps://www.ingentaconnect.com/content/asp/jnn/2016/00000016/00000011/art00039;jsessionid=5hjejodp3gthf.x-ic-live-02-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/100989-
dc.description.abstractTransparent conducting oxides (TCOs) are very important materials for application in flat panel displays, thin-film solar cells, and touch panels. These days, the low-temperature synthesis of TCO thin films is being actively researched for realizing flexible electronics such as displays and solar cells. TCO thin films, mainly tin-doped indium oxide, are normally fabricated by high-vacuum sputtering. However, fluorine-doped tin oxide (FTO) has been in use for thin-film solar cells from the beginning. Our study attempts to lower the deposition temperature of FTO to 250 degrees C, which is suitable for deposition on polyimide substrates. We varied the F/Sn precursor ratio at different deposition temperatures, and found that a low F/Sn ratio of about 0.15 produces the lowest electrical resistivity below 350 degrees C, whereas a F/Sn ratio of 1.5 is obtained at 450 degrees C. At lower temperatures, crystal growth is very slow, and therefore, we should conduct very slow deposition to obtain high-quality TCO thin films.en_US
dc.description.sponsorshipThe authors are appreciated for financial support for this research work by Core Material Research Program of Korean Ministry of Commerce, Industry and Energy (Project No. 10041161) and partial support from the Strategic Research Development Program of Korea Institute of Ceramic Engineering and Technology (KPP12002).en_US
dc.language.isoenen_US
dc.publisherAMER SCIENTIFIC PUBLISHERSen_US
dc.subjectTransparent Conducting Oxideen_US
dc.subjectFluorine Doped Tin Oxideen_US
dc.subjectSpray Pyrolysis Depositionen_US
dc.subjectDoping Ratioen_US
dc.subjectElectrical Resistivityen_US
dc.titleDoping Ratio Control of Fluorine-Doped Tin Oxide for a High-Quality Transparent Conducting Electrodeen_US
dc.typeArticleen_US
dc.relation.no11-
dc.relation.volume16-
dc.identifier.doi10.1166/jnn.2016.13503-
dc.relation.page11330-11334-
dc.relation.journalJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.contributor.googleauthorKim, Chang-Yeoul-
dc.contributor.googleauthorGo, Eun-Byul-
dc.contributor.googleauthorChoi, Jae-Seok-
dc.contributor.googleauthorChoi, Sung Churl-
dc.relation.code2016003411-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidchoi0505-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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