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Showing results 161 to 180 of 352

Issue DateTitleAuthor(s)
2012-02Fabrication of Large-Area CoNi Mold for Nanoimprint Lithography박진구
2005-06Fabrication of metal line on plastic substrate by hot embossing and CMP process박진구
2006-11Fabrication of nano- and micro-scale UV imprint stamp using diamond-like carbon coating technology박진구
2005-06Fabrication of plastic CE(capillary electrophoresis) microchip by hot embossing process박진구
2018-10Fabrication of Stainless Steel Metal Mask with Electrochemical Fabrication Method and Its Improvement in Dimensional Uniformity박진구
2007-11Fabrication of stainless steel mold using electro chemical fabrication (ECF) method for microfluidic biochip박진구
2008-06Fabrication of stainless steel mold using electrochemical fabrication method for microfluidic biochip박진구
2013-04Fluorocarbon film-assisted fabrication of a CoNi mold with high aspect ratio for nanoimprint lithography박진구
2013-04Fluorocarbon film-assisted fabrication of a CoNi mold with high aspect ratio for nanoimprint lithography박진구
2021-02Formulation and Evaluation of Diluted Sulfuric-Peroxide-HF (DSP+) Mixtures for Cleaning High-Aspect Ratio Contacts in 3D NAND박진구
2011-02Generation of Pad Debris during Oxide CMP Process and Its Role in Scratch Formation박진구
2011-02Generation of Pad Debris during Oxide CMP Process and Its Role in Scratch Formation박진구
2013-05Hybrid Cleaning Technology for Enhanced Post-Cu/Low-Dielectric Constant Chemical Mechanical Planarization Cleaning Performance박진구
2013-05Hybrid Cleaning Technology for Enhanced Post-Cu/Low-Dielectric Constant Chemical Mechanical Planarization Cleaning Performance박진구
2020-02Hybrid DHF and N-2 jet spray cleaning for silicon nitride and metal layer DRAM patterns박진구
2020-02Hybrid DHF and N2 jet spray cleaning for silicon nitride and metal layer DRAM patterns박진구
2011-07Hydrophobic Modification of Diamond Conditioner for Prevention of Particle Adhesion During Oxide CMP박진구
2011-07Hydrophobic Modification of Diamond Conditioner for Prevention of Particle Adhesion During Oxide CMP박진구
2013-11The impact of diamond conditioners on scratch formation during chemical mechanical planarization (CMP) of silicon dioxide박진구
2017-03Impact of non-uniform wrinkles for a multi-stack pellicle in EUV lithography박진구

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