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Noise Properties of Coherent Tunneling Processes in Resonant Interband Tunneling Diode

Title
Noise Properties of Coherent Tunneling Processes in Resonant Interband Tunneling Diode
Author
정희준
Keywords
SiGe; Resonant interband tunneling diodes; Shot noise; Cross-correlation
Issue Date
2008-10
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 53, No. 4, Page. 2002-2005
Abstract
Tunneling noise properties were studied with SiGe resonant interband tunneling diodes (RITDs). The classification of sub- and super-Poissonian processes was evaluated through a study of the shot noise. Shot noise suppression and the signatures of coherent transport were observed in the negative differential resistance (NDR) region by using the cross-correlation measurement technique. The temperature dependent transport behaviors are discussed.
URI
http://www.jkps.or.kr/journal/view.html?volume=53&number=4&spage=2002&year=2008http://repository.hanyang.ac.kr/handle/20.500.11754/80702
ISSN
0374-4884
DOI
10.3938/jkps.53.2002
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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