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Issue DateTitleAuthor(s)
2005-11Defect characterization of Ru/Mo/Si EUV reflector by optical modeling오혜근
2005-06Calibration-Free Multichannel Ellipsometry for Retardance Measurement오혜근
2005-06Bulk effects of thermal flow resists오혜근
2005-06Calibration-Free Multichannel Ellipsometry for Retardance Measurement김옥경
2005-05Nonlinear Plasma Screening Effects on Elastic Electron-Dust Grain Collisions in Dusty Plasmas김옥경
2005-05Reduction in the Mask Error Factor by Optimizing the Diffraction Order of a Scattering Bar in Lithography오혜근
2005-04Reduction of the Absorber Shadow Effect by Changing the Absorber Side Wall Angle in Extreme Ultraviolet Lithography오혜근
2005-04Chirp Parameter of Electroabsorption Modulators with InGaAsP Intrastep Quantum Wells정희준
2005-03Line width variation with absorber thickness in extreme ultraviolet lithography오혜근
2005-03Contact hole reflow by finite element method오혜근
2005-05Simulation of thermal resist flow process오혜근
2005-06ArF photoresist parameter optimization for mask error enhancement factor reduction오혜근
2005-05The evaluation of aberration effects according to pattern shape and duty ratio오혜근
2005-03Three-Party Quantum Teleportation with Asymmetric States권영헌
2005-04Interaction-aided continuous time quantum search권영헌
2005-02Ferromagnetic properties of epitaxial SrRuO3 films on SiO2/Si using biaxially oriented MgO as templates강보수
2005-02Fabrication of Quantum Well Infrared Photodetectors using Chemically Wet-Etched Grid Nanostructures정희준
2005-01Controlling the nanostructure of RuO2/carbon nanotubes composites by using gas-annealing강보수
2005-01Retention properties of fully integrated (Bi,La)4Ti3O12 capacitors and their lateral size effects강보수
2006-12Adaptive Noise Estimation Using Least-Squares Line in Wavelet Packet Transform Domain권영헌