Articles 208 Collection home page


| Subscribe to this collection to receive daily e-mail notification of new additions 

Issue DateTitleAuthor(s)
2019-08Discontinuous percolation transitions in growing networks손승우
2019-07Uniqueness of Minimax Strategy in View of Minimum Error Discrimination of Two Quantum States권영헌
2019-04Switching dynamics and modeling of multi-domain Zr-Doped HfO2 ferroelectric thin films강보수
2019-04Effects of repetitive polarization switching on the coercive voltage of Pt/Pb(Zr0.52Ti0.48 )O-3/Pt thin films analyzed using impedance spectroscopy강보수
2019-04Effects of Pb content and electrode materials on the ferroelectric properties of Pb(Zr0.52Ti0.48)O-3 thin films강보수
2019-03Negative capacitance phenomena depending on the wake-up effect in the ferroelectric Si:HfO2 film강보수
2005-12A compensation of Young's modulus in polysilicon structure with discontinuous material distribution정희준
2006-04Quantum Teleportation in Three Parties with an Accelerated Receiver권영헌
2005-12ZnO 첨가에 따른 0.67Pb(Mg1/33Nb2/3)O3-0.33PbTiO3 세라믹스의 상전이 온도와 압전특성의 변화김옥경
2005-12Wavelet Quantum Search Algorithm with Partial Information권영헌
2005-12Rigorous coupled-wave analysis를 이용한 극자외선 리소그래피에서 그림자 효과를 줄이기 위한 마스크 변형오혜근
2005-11Simulator for resist-reflow process by boundary movement오혜근
2005-10Best Fidelity Condition for Three Party Quantum Teleportation권영헌
2005-10Reticle Haze Measurement by Spectroscopic Ellipsometry오혜근
2005-10Mask Error Enhancement Factor Variation with Pattern Density오혜근
2005-10ArF photoresist parameter optimization for mask error enhancement factor reduction오혜근
2005-10Rubbed Polyimide Layers Studied by Rotating Sample and Compensator Spectroscopic Ellipsometry오혜근
2005-08Line-width variation with absorber thickness in extreme ultraviolet lithography오혜근
2005-07Determination of the optical functions of various liquids by rotating compensator multichannel spectroscopic ellipsometry오혜근
2005-07Lens aberration effect on the line width for different pattern shapes and duty ratios오혜근