Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김용수 | - |
dc.date.accessioned | 2018-08-24T02:03:57Z | - |
dc.date.available | 2018-08-24T02:03:57Z | - |
dc.date.issued | 2016-07 | - |
dc.identifier.citation | OPTIK (2016), v. 127, NO. 20, Page. 9152-9160 | en_US |
dc.identifier.issn | 0030-4026 | - |
dc.identifier.uri | https://www.sciencedirect.com/science/article/pii/S0030402616307604?via%3Dihub | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/74504 | - |
dc.description.abstract | This study reports the spectroscopic and microstructural characterization of helium (He+) ions irradiated pure Aluminum (Al) (99.99%). The specimens of Al were irradiated by 18 MeV helium (He+) ions in the fluence range of 1 x 10(13) ions/cm(2) - 1 x 10(16) ions/cm(2) at 300 K under vacuum conditions using Cyclotron accelerator. The Field emission scanning electron microscope (FESEM) analysis reveals the generation and growth of cavities, micro size pits, voids and incoherent structures at various irradiation fluences, due to melting, re deposition and exfoliational sputtering of the irradiated surface. The X-ray diffractometer (XRD) results depicted significant variations in diffraction peaks intensities, peak shifting and broadening that became more pronounced with an increase of the irradiation fluence, whereas, anomalous behavior in crystallite size and lattice strain is observed after irradiation. These structural changes are related to the accumulation of irradiation induced stresses inside the lattice structure. (C) 2016 Elsevier GmbH. All rights reserved. | en_US |
dc.description.sponsorship | This work was supported by the Research Fund of Survivability Technology Defense Research Center ofAgency for Defense Development of Korea (No. UD120019OD). | en_US |
dc.language.iso | en | en_US |
dc.publisher | ELSEVIER GMBH | en_US |
dc.subject | Pure aluminum | en_US |
dc.subject | Field emission scanning electron | en_US |
dc.subject | microscope | en_US |
dc.subject | Surface morphology | en_US |
dc.subject | Ions irradiation | en_US |
dc.subject | X-ray diffraction | en_US |
dc.title | Spectroscopic and microstructural characterization of 18 MeV He+ ions irradiated pure Al | en_US |
dc.type | Article | en_US |
dc.relation.no | 20 | - |
dc.relation.volume | 127 | - |
dc.identifier.doi | 10.1016/j.ijleo.2016.06.130 | - |
dc.relation.page | 9152-9160 | - |
dc.relation.journal | OPTIK | - |
dc.contributor.googleauthor | Chae, San | - |
dc.contributor.googleauthor | Kim, Yong-Soo | - |
dc.contributor.googleauthor | Rafique, Mohsin | - |
dc.relation.code | 2016002339 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF NUCLEAR ENGINEERING | - |
dc.identifier.pid | yongskim | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.