A Novel Fault Detection Circuit for Short-Circuit Faults of IGBT
- Title
- A Novel Fault Detection Circuit for Short-Circuit Faults of IGBT
- Author
- 현동석
- Issue Date
- 2011-04
- Publisher
- Institute of Electrical and Electronics Engineers
- Citation
- 2011 Twenty-Sixth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE. :359-363 Mar, 2011
- Abstract
- This paper proposed a novel fault detection circuit comparing the gate voltage of IGBT. The proposed scheme is operated to protect IGBT under short-circuit faults such as hard switch-fault (HSF). The proposed circuit consists of two parts. One is the difference generator which generates a difference between a gate voltage and an input voltage. The other is the short-circuit fault detector using a charged voltage of capacitor for short-circuit fault detection. The feasibility of the proposed short-circuit detecting scheme is verified by simulation results.
- URI
- http://ieeexplore.ieee.org/document/5744621/https://repository.hanyang.ac.kr/handle/20.500.11754/72780
- ISBN
- 978-1-4244-8085-2; 978-1-4244-8084-5; 978-1-4244-8083-8
- ISSN
- 1048-2334
- DOI
- 10.1109/APEC.2011.5744621
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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