Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정진욱 | - |
dc.date.accessioned | 2018-04-03T07:46:08Z | - |
dc.date.available | 2018-04-03T07:46:08Z | - |
dc.date.issued | 2014-09 | - |
dc.identifier.citation | Journal of Applied Physics, 2014, 116(9), P.093302-1~093302-5 | en_US |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | https://aip.scitation.org/doi/abs/10.1063/1.4894517 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/57312 | - |
dc.description.abstract | Plasma diagnostic methods using harmonic currents analysis of electrostatic probes were experimentally investigated to understand the differences in their measurement of the plasma parameters. When dual frequency voltage (ω1,ω2) was applied to a probe, various harmonic currents (ω1,?2ω1,ω2,?2ω2,ω2±ω1,ω2±2ω1) were generated due to the non-linearity of the probe sheath. The electron temperature can be obtained from the ratio of the two harmonics of the probe currents. According to the combinations of the two harmonics, the sensitivities in the measurement of the electron temperature differed, and this results in a difference of the electron temperature. From experiments and simulation, it is shown that this difference is caused by the systematic and random noise. | en_US |
dc.description.sponsorship | This work was supported by the Converging Research Center Program (NRF-2014M3C1A8053701), National R&DProgram (NRF-2014M1A7A1A03045185), and the Basic Science Research Program (NRF-2012R1A1B3001557) of theNational Research Foundation of Korea funded by the Ministry of Education, Science, and Technology, and this work was supported by the Industrial Strategic Technology Development Program (10041681, 10049164) and IT R&D program of MOTIE/KEIT (10045232) funded by the Ministry of Knowledge Economy. | en_US |
dc.language.iso | en | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.subject | 71 CLASSICAL AND QUANTUM MECHANICS | en_US |
dc.subject | GENERAL PHYSICS | en_US |
dc.subject | CURRENTS | en_US |
dc.subject | ELECTRIC POTENTIAL | en_US |
dc.subject | ELECTRON TEMPERATURE | en_US |
dc.subject | ELECTROSTATIC PROBES | en_US |
dc.subject | HARMONICS | en_US |
dc.subject | NOISE | en_US |
dc.subject | PLASMA DIAGNOSTICS | en_US |
dc.subject | RANDOMNESS | en_US |
dc.subject | SENSITIVITY | en_US |
dc.subject | SIMULATION | en_US |
dc.title | Investigation of plasma diagnostics using a dual frequency harmonic technique | en_US |
dc.type | Article | en_US |
dc.relation.volume | 116 | - |
dc.identifier.doi | 10.1063/1.4894517 | - |
dc.relation.page | 933021-933025 | - |
dc.relation.journal | JOURNAL OF APPLIED PHYSICS | - |
dc.contributor.googleauthor | Kim, Dong-Hwan | - |
dc.contributor.googleauthor | Kim, Young-Do | - |
dc.contributor.googleauthor | Cho, Sung-Won | - |
dc.contributor.googleauthor | Kim, Yu-Sin | - |
dc.contributor.googleauthor | Chung, Chin-Wook | - |
dc.relation.code | 2014032385 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING | - |
dc.identifier.pid | joykang | - |
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