Hanyang University repository
menu
검색
Library
Hanyang
Browse
Communities & Collections
Titles
Authors
My Repository
My Account
Receive email updates
Edit Profile
Repository at Hanyang University
Search
All of Repository
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학)
APPLIED CHEMISTRY(응용화학과)
APPLIED MATHEMATICS(응용수학과)
APPLIED PHYSICS(응용물리학과)
CHEMICAL AND MOLECULAR ENGINEERING(화학분자공학과)
MARINE SCIENCE AND CONVERGENCE ENGINEERING(해양융합공학과)
MARINE SCIENCES AND CONVERGENT TECHNOLOGY(해양융합과학과)
MOLECULAR AND LIFE SCIENCE(분자생명과학과)
PHOTONICS AND NANOELECTRONICS(나노광전자학과)
ETC
Start a new search
Current filters:
Title
Author
Subject
Date Issued
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Add filters:
Title
Author
Subject
Date Issued
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort items by
Relevance
Title
Issue Date
In order
Ascending
Descending
Authors/record
All
1
5
10
15
20
25
30
35
40
45
50
Results 1-9 of 9 (Search time: 0.002 seconds).
Item hits:
Issue Date
Title
Author(s)
2004-12
Advances in multichannel ellipsometric techniques for in-situ and real-time characterization of thin films
안일신
2004-07
Photoinduced patterning of gold thin film
안일신
2004-08
Morphological development and etching of gold thin film under UV-exposure in Chlorine-based liquids
안일신
2004-05
Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle
안일신
2004-05
Calibration and data reduction for a UV-extended rotating-compensator multichannel ellipsometer
안일신
2004-06
The Extraction of Develop Parameters by Using Cross-Sectional Critical Shape Error Method
안일신
2004-06
Effect of Extreme Ultraviolet Light Scattering from the Rough Absorber and Buffer Side Wall
안일신
2004-05
Simultaneous determination of bulk isotropic and surface-induced anisotropic complex dielectric functions of semiconductors from high speed Mueller matrix ellipsometry
안일신
2004-05
Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry
안일신
previous
1
next
Discover
-Subject
2
ALIGNMENT
2
BIPLATE COMPENSATOR
2
Data reduction
2
Dual-rotating compensator ellipso...
2
Ellipsometer calibration
2
Multichannel Mueller matrix ellip...
1
2-MODULATOR GENERALIZED ELLIPSOMETRY
1
absorber
1
Anisotropic thin films
1
AU(111)
next >
BROWSE
Communities & Collections
Titles
Authors