Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review
- Title
- Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review
- Author
- 배성철
- Keywords
- X-ray; Tomography; Tomography; High pressure; X-ray diffraction; High pressure
- Issue Date
- 2013-06
- Publisher
- 한국콘크리트학회
- Citation
- International journal of concrete structures and materials, 2013, 7(2), p.95 - 110
- Abstract
- We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure x-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed - a study of pores, connectivity, and morphology of a 2000 year old concrete using nanotomography
- URI
- https://link.springer.com/article/10.1007%2Fs40069-013-0036-1http://hdl.handle.net/20.500.11754/46454
- ISSN
- 1229-5515
- DOI
- 10.1007/s40069-013-0036-1
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ARCHITECTURAL ENGINEERING(건축공학부) > Articles
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML