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Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

Title
Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review
Author
배성철
Keywords
X-ray; Tomography; Tomography; High pressure; X-ray diffraction; High pressure
Issue Date
2013-06
Publisher
한국콘크리트학회
Citation
International journal of concrete structures and materials, 2013, 7(2), p.95 - 110
Abstract
We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure x-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed - a study of pores, connectivity, and morphology of a 2000 year old concrete using nanotomography
URI
https://link.springer.com/article/10.1007%2Fs40069-013-0036-1http://hdl.handle.net/20.500.11754/46454
ISSN
1229-5515
DOI
10.1007/s40069-013-0036-1
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ARCHITECTURAL ENGINEERING(건축공학부) > Articles
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