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dc.contributor.author김영호-
dc.date.accessioned2018-03-10T02:57:02Z-
dc.date.available2018-03-10T02:57:02Z-
dc.date.issued2013-05-
dc.identifier.citationCurrent Applied Physics, 2013, 13, P.S14-S25,en_US
dc.identifier.issn1567-1739-
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S1567173913002010?via%3Dihub-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/44599-
dc.description.abstractRecently, the flip-chip bonding technology using adhesives has been widely used in the packaging industry because of environmental friendliness (elimination of lead material and flux cleaning), low temperature process (no soldering process), fewer processing steps (no underfill process), and the fine pitch capability. In flip-chip assembly using adhesives, the electrical interconnection is established by mechanical contact between the bumps on the chip and the corresponding pads on the substrate after the adhesive is cured. The adhesive can be categorized into two types with respect to the presence of the conductive particles: anisotropic conductive film (ACF) and nonconductive adhesive (NCA). ACF is the adhesive polymer film with dispersed conductive particles, and NCA is just adhesive which contains no conductive particles. In this review, the bonding technologies with ACF and NCA are introduced, and the principle and characteristics of each bonding method are discussed.en_US
dc.description.sponsorshipThis research was supported by a grant (F0004061-2011-34) from Information Display R&D Center, one of the Knowledge Economy Frontier R&D Program funded by the Ministry of Knowledge Economy of Korean government, and by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MEST) (no. 2011-0015735).en_US
dc.language.isoenen_US
dc.publisherElsevier B.V.en_US
dc.subjectFlip chip bondingen_US
dc.subjectAnisotropic conductive filmen_US
dc.subjectNonconductive adhesiveen_US
dc.titleFlip chip bonding with anisotropic conductive film (ACF) and nonconductive adhesive (NCA)en_US
dc.typeArticleen_US
dc.relation.noSpecial SI-
dc.relation.volume13-
dc.identifier.doi10.1016/j.cap.2013.05.009-
dc.relation.page14-25-
dc.relation.journalCURRENT APPLIED PHYSICS-
dc.contributor.googleauthorKim, Sun-Chul-
dc.contributor.googleauthorKim, Young-Ho-
dc.relation.code2013009613-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidkimyh-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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