Results 1-3 of 3 (Search time: 0.001 seconds).
Issue Date | Title | Author(s) |
---|---|---|
2008-05 | Low Cost Scan Test for IEEE 1500-Based SoC | 박성주 |
2016-04 | Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells | 박성주 |
2008-05 | Low-cost scan test for IEEE-1500-Based SoC | 박성주 |