In this paper, wavelength of the white light was controlled by Cut-off filters. Also, the flash white light irradiation condition was optimized to obtain the high conductivity of copper film. The microstructures of the sintered copper films were observed using a scanning electron microscope (SEM). The sheet resistance of the sintered copper films was measured using a four-point probe method. From these results, the sheet resistance of wavelength controlled flash light sintered copper films decreased than that of no-filtered flash light sintered copper films. Therefore, it is expected that wavelength controlled flash light will be used in the future in highly electrical conductive electrodes of printed electronics.