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dc.contributor.author김학성-
dc.date.accessioned2016-11-11T04:44:58Z-
dc.date.available2016-11-11T04:44:58Z-
dc.date.issued2015-04-
dc.identifier.citation재료 및 파괴부문 춘계학술대회 논문집 , 2015.4, 265-266en_US
dc.identifier.urihttp://www.dbpia.co.kr/Article/NODE06269276-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/24304-
dc.description.sponsorship본 논문은 정부(교육부)의 재원으로 한국연구재단의 지원을 받아 수행된 연구임.(No.2012R1A6A1029029 and 2013M2A2A9043280).en_US
dc.language.isoko_KRen_US
dc.publisher대한기계학회en_US
dc.title테라헤르츠파 비파괴검사법을 이용한 반도체 패키징 내부 공동 검출에 관한 연구en_US
dc.title.alternativeThe detection of the voids in semiconductor packages using non-destructive evaluation of THz-TDSen_US
dc.typeArticleen_US
dc.relation.page1-2-
dc.contributor.googleauthor박성현-
dc.contributor.googleauthor장진욱-
dc.contributor.googleauthor김학성-
dc.contributor.googleauthorPark, Sung Hyeon-
dc.contributor.googleauthorJang, Jin Wook-
dc.contributor.googleauthorKim, Hak Sung-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MECHANICAL ENGINEERING-
dc.identifier.pidkima-
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COLLEGE OF ENGINEERING[S](공과대학) > MECHANICAL ENGINEERING(기계공학부) > Articles
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