Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성주 | - |
dc.date.accessioned | 2023-08-22T01:44:38Z | - |
dc.date.available | 2023-08-22T01:44:38Z | - |
dc.date.issued | 2009-01 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v. 56, NO. 1, Page. 56-60 | - |
dc.identifier.issn | 1549-7747;1558-3791 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/4753705 | en_US |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/185664 | - |
dc.description.abstract | The effect of crosstalk-induced errors becomes more significant in high-performance circuits and systems. In this paper, compact crosstalk test patterns are introduced for a system-on-a-chip and board level interconnects considering physically effective aggressors. By being able to target multiple victim lines, 6n, where n is the number of nets patterns are drastically reduced to a constant number 6D, where D indicates the effective distance among interconnect nets. The test quality for static and crosstalk faults are completely preserved with 6D patterns. | - |
dc.description.sponsorship | Manuscript received February 24, 2008; revised July 01, 2008 and September 28, 2008. Current version published January 16, 2009. This work was supported by ETRI SoC Industry Promotion Center, Human Resource Development Project for IT SoC Architect. This paper was recommended by Associate Editor M. Anis. | - |
dc.language | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | Crosstalk faults | - |
dc.subject | interconnect test | - |
dc.subject | static faults | - |
dc.subject | system-on-a-chip (SoC) | - |
dc.subject | test pattern | - |
dc.title | Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults | - |
dc.type | Article | - |
dc.relation.no | 1 | - |
dc.relation.volume | 56 | - |
dc.identifier.doi | 10.1109/TCSII.2008.2010168 | - |
dc.relation.page | 56-60 | - |
dc.relation.journal | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | - |
dc.contributor.googleauthor | Song, Jaehoon | - |
dc.contributor.googleauthor | Han, Juhee | - |
dc.contributor.googleauthor | Yi, Hyunbean | - |
dc.contributor.googleauthor | Jung, Taejin | - |
dc.contributor.googleauthor | Park, Sungju | - |
dc.sector.campus | E | - |
dc.sector.daehak | 소프트웨어융합대학 | - |
dc.sector.department | 소프트웨어학부 | - |
dc.identifier.pid | paksj | - |
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