Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정희준 | - |
dc.date.accessioned | 2023-07-24T01:59:12Z | - |
dc.date.available | 2023-07-24T01:59:12Z | - |
dc.date.issued | 2011-05 | - |
dc.identifier.citation | Journal of Applied Physics, v. 109, NO. 10, article no. 102419, Page. 1-5 | - |
dc.identifier.issn | 0021-8979;1089-7550 | - |
dc.identifier.uri | https://aip.scitation.org/doi/10.1063/1.3578345 | en_US |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/184294 | - |
dc.description.abstract | We present the measurement of charge transport through phenylene conjugated molecules using electromigrated nanogap junctions. To elucidate the intrinsic transport properties of the conjugated molecular junctions, a variety of molecular transport techniques were performed at low temperature, including inelastic electron tunneling spectroscopy, temperature- and length-variable transport measurements, and transition voltage spectroscopy. Such a self-consistent characterization of the molecular junction demonstrates the observation of intrinsic molecular properties in these junctions. (C) 2011 American Institute of Physics. [doi :10.1063/1.3578345] | - |
dc.description.sponsorship | This work was supported by the Korean National Research Laboratory program, a Korean National Core Research Center grant, the World Class University program of the Korean Ministry of Education, Science and Technology of Korea, the Program for Integrated Molecular System at the Gwangju Institute of Science and Technology, the US Army Research Office (W911NF-08-1-0365), and the Canadian Institute for Advanced Research (CIfAR). | - |
dc.language | en | - |
dc.publisher | American Institute of Physics | - |
dc.subject | SELF-ASSEMBLED MONOLAYERS | - |
dc.subject | ATOMIC-FORCE MICROSCOPY | - |
dc.subject | SPECTROSCOPY | - |
dc.subject | CONDUCTION | - |
dc.subject | FABRICATION | - |
dc.subject | METAL JUNCTIONS | - |
dc.subject | ELECTRON-TRANSPORT | - |
dc.title | Intrinsic charge transport of conjugated organic molecules in electromigrated nanogap junctions | - |
dc.type | Article | - |
dc.relation.no | 10 | - |
dc.relation.volume | 109 | - |
dc.identifier.doi | 10.1063/1.3578345 | - |
dc.relation.page | 1-5 | - |
dc.relation.journal | Journal of Applied Physics | - |
dc.contributor.googleauthor | Song, Hyunwook | - |
dc.contributor.googleauthor | Kim, Youngsang | - |
dc.contributor.googleauthor | Jeong, Heejun | - |
dc.contributor.googleauthor | Reed, Mark A. | - |
dc.contributor.googleauthor | Lee, Takhee | - |
dc.sector.campus | E | - |
dc.sector.daehak | 과학기술융합대학 | - |
dc.sector.department | 응용물리학과 | - |
dc.identifier.pid | hjeong | - |
dc.identifier.article | 102419 | - |
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