Effects of the fluctuation in a singly-connected conducting filament structure on the distribution of the reset parameters in unipolar resistance switching
- Title
- Effects of the fluctuation in a singly-connected conducting filament structure on the distribution of the reset parameters in unipolar resistance switching
- Author
- 강보수
- Issue Date
- 2015-03
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v. 106, NO. 13, article no. 133503, Page. 1.0-5.0
- Abstract
- The reset current (I-reset), voltage (V-reset), and resistance of the low resistance state, as functions of the compliance current (CC), were investigated in a Pt/NiO/Pt structure that showed unipolar resistance switching. Interestingly, the I-reset and the V-reset measured at low CCs were found to be widely distributed. In order to explain the behavior of the reset parameters for the singly-connected conducting filament (CF) structure, a simple model of CFs was employed whose width variation follows the Gaussian distribution. The wide distribution of the reset parameters can be attributed to the fluctuation in the number and/or the width of the CFs. (C) 2015 AIP Publishing LLC.
- URI
- https://aip.scitation.org/doi/10.1063/1.4916742https://repository.hanyang.ac.kr/handle/20.500.11754/182233
- ISSN
- 0003-6951;1077-3118
- DOI
- 10.1063/1.4916742
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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