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Radiative and non-radiative carrier lifetimes in InGaN-based light-emitting diodes investigated by impedance analysis

Title
Radiative and non-radiative carrier lifetimes in InGaN-based light-emitting diodes investigated by impedance analysis
Author
신동수
Issue Date
2016-01
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015, v. 1, article no. 7375898, Page. 1-2
Abstract
To investigate the efficiency droop in InGaN-based light-emitting diodes, we have measured the differential carrier lifetimes using the electrical method. After separating the radiative and non-radiative carrier lifetimes using the internal quantum efficiency, we discuss their implications. © 2015 IEEE.
URI
https://ieeexplore.ieee.org/document/7375898https://repository.hanyang.ac.kr/handle/20.500.11754/181869
DOI
10.1109/CLEOPR.2015.7375898
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
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