Articles 81 Collection home page


| Subscribe to this collection to receive daily e-mail notification of new additions 

Issue DateTitleAuthor(s)
2018-07Investigation of luminance degradation in organic light-emitting diodes by impedance spectroscopy심종인
2018-08Problems of Using a Solvent-cleansed Silicon Oxide Substrate as the Friction Reference Sample at the Nanoscale김수은
2018-08Atomic-level Sharpening of a Carbon Nanotube Tip for High-resolution Scanning Tunneling Microscopy김수은
2018-08Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy김수은
2018-08Coherence length of a Yb fibre superfluorescent source with an adjustable linewidth김지원
2018-07Investigation of Forward Tunneling Characteristics of InGaN/GaN Blue Light-Emitting Diodes on Freestanding GaN Detached from a Si Substrate김재균
2018-06Manipulation and Investigation of Uniformly-Spaced Nanowire Array on a Substrate via Dielectrophoresis and Electrostatic Interaction김재균
2018-05Local entanglement entropy of fermions as a marker of quantum phase transition in the one-dimensional Hubbard model차민철
2018-05High-performance organic circuits based on precisely aligned single-crystal arrays김재균
2018-05Optoelectronic performance variations in InGaN/GaN multiple-quantum-well light-emitting diodes: Effects of potential fluctuation심종인
2018-04Measuring the internal quantum efficiency of light-emitting diodes at an arbitrary temperature심종인
2018-04Characterization of Free-Standing Nano-Membranes by Using Ellipsometry안일신
2018-04High-performance and scalable metal-chalcogenide semiconductors and devices via chalco-gel routes김재균
2018-04Light output performance of red AlGaInP-based light emitting diodes with different chip geometries and structures심종인
2018-03Comparison null imaging ellipsometry using polarization rotator김지원
2018-03Comparison null imaging ellipsometry using polarization rotator안일신
2018-02Factors determining the carrier distribution in InGaN/GaN multiple-quantum-well light-emitting diodes심종인
2008-11A Mask Generation Approach to Double Patterning Technology with Inverse Lithography안일신
2008-11Patterning of 32 nm 1:1 Line and Space by Resist Reflow Process안일신
2008-10Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy김수은