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Self-purification model for metal-assisted chemical etching of metallurgical silicon

Title
Self-purification model for metal-assisted chemical etching of metallurgical silicon
Author
이정호
Keywords
Metal assisted chemical etching; metallurgical silicon; purification effect; transitional metal impurity; etching model
Issue Date
2014-08
Publisher
Pergamon Press Ltd.
Citation
Electrochimica Acta, v. 138, Page. 476-480
Abstract
Metal-assisted chemical etching (MaCE) of metallurgical-grade silicon (MG-Si) has improved the purity of MG-Si (similar to 99%) to close to solar-grade (similar to 99.9999%) by removing metal impurities during the successful preparation of porous silicon nanowires (SiNWs). A new etching principle is proposed to explain the different levels of chemical reduction between various metal impurities with pore formation during etching. This model provides chemical insights into the relationship between dissolved metal ions and pores evolved during the formation of SiNWs. (C) 2014 Elsevier Ltd. All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S0013468614010329?via%3Dihubhttps://repository.hanyang.ac.kr/handle/20.500.11754/181353
ISSN
0013-4686;1873-3859
DOI
10.1016/j.electacta.2014.05.048
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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