Repository at Hanyang UniversityCOLLEGE OF ENGINEERING SCIENCES[E](공학대학)MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과)Articles
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박진구 | - |
| dc.date.accessioned | 2022-07-29T00:46:45Z | - |
| dc.date.available | 2022-07-29T00:46:45Z | - |
| dc.date.issued | 2021-02 | - |
| dc.identifier.citation | Solid State Phenomena, v. 314, Page. 228-233 | en_US |
| dc.identifier.issn | 1662-9779 | - |
| dc.identifier.uri | https://www.scientific.net/SSP.314.228 | - |
| dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/171888 | - |
| dc.description.abstract | The adhesion behavior of thermally aged particles was studied by characterizing the footprint, which could be formed between a particle and a substrate. To understand the formation mechanism of the footprint, the effects of temperature and aging time on the particle removal were studied. Understanding the particle adhesion and removal aged at high temperatures is important to maintain the cleanness of the wafer backside where many contaminants could adhere on in various wafer process chambers. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Scientific.net | en_US |
| dc.subject | Particle Defect | en_US |
| dc.subject | Wafer backside | en_US |
| dc.subject | Footprint | en_US |
| dc.subject | Thermal aging | en_US |
| dc.subject | Cleaning | en_US |
| dc.title | The Effect of Thermal Aging on Nano-Particle Removal | en_US |
| dc.type | Article | en_US |
| dc.relation.volume | 314 | - |
| dc.identifier.doi | 10.4028/www.scientific.net/SSP.314.228 | - |
| dc.relation.page | 228-233 | - |
| dc.relation.journal | Solid State Phenomena | - |
| dc.contributor.googleauthor | Kim, Yeoho | - |
| dc.contributor.googleauthor | Jin, Seung Wan | - |
| dc.contributor.googleauthor | Kim, Hyun-Tae | - |
| dc.contributor.googleauthor | Kim, Tae-Gon | - |
| dc.contributor.googleauthor | Won, Kyu-Hwang | - |
| dc.contributor.googleauthor | Park, Jin-Goo | - |
| dc.relation.code | 2021035264 | - |
| dc.sector.campus | E | - |
| dc.sector.daehak | COLLEGE OF ENGINEERING SCIENCES[E] | - |
| dc.sector.department | DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING | - |
| dc.identifier.pid | jgpark | - |
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