두 개의 이상원인을 고려한 VSS ¯ X 관리도의 통계적 설계

Abstract

In this paper we apply VSS X Bar chart to the case when two assignable causes effect the process mean shift. We compare the case when teo compound assignable causes effect the process mean with another one which effects individually. For the practical use of VSS X Bar chart we propose the sample size which minimizes the average number of samples until the signal is given in out-of-control state.